Reflectance measurements and optical constants in the extreme ultraviolet for thin films of ion-beam-deposited SiC, Mo, Mg2Si, and InSb and of evaporated Cr

Applied Optics

Volumn 39, Issue 16, 2000, Pages 2772-2781

  Larruquert, Juan I ^a,b   Keski Kuha, Ritva A M ^a  

^a NASA Goddard Space Flight Center   (Spain)

^b Consejo Superior de Investigaciones Científicas   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAM ASSISTED DEPOSITION; MULTILAYERS; OPTICAL MATERIALS; REFLECTION;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0037963517     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.39.002772     Document Type: Article

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