Optical constants determination of neodymium and gadolinium in the 3 nm to 100 nm wavelength range

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6317, Issue , 2006, Pages

  Kjornrattanawanich, B ^a   Windt, D L ^b   Uspenskii, Y A ^c   Seely, J F ^d  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b Reflective X ray Optics LLC   (United States)

^c LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

^d NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Extreme ultraviolet; Gd; Multilayers; Nd; Optical constants; Rare earth; Solar imager

Indexed keywords

EXTREME ULTRAVIOLET; OPTICAL CONSTANTS; SOLAR IMAGERS; WAVELENGTH RANGES;

GADOLINIUM; MULTILAYERS; OPTICAL PROPERTIES; OXIDATION; PHOTODIODES; RARE EARTH ELEMENTS; REFRACTIVE INDEX; SILICON; SYNCHROTRON RADIATION; THICKNESS CONTROL;

NEODYMIUM;

EID: 33750603404     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.681952     Document Type: Conference Paper

References (9)

1. U. Feldman, J. D. Purcell, and B. Dohne, "An atlas of extreme ultraviolet spectroheliograms from 170 to 625 angstroms," Naval Research Laboratory Publication, 1987.
2. W. Curdt, P. Brekke, U. Feldman, K. Wilhelm, B. N. Dwivedi, U. Schühle, and P. Lemaire, "The SUMER spectral atlas of the solar disk features," Astronomy & Astrophysics 375, 591 (2001).
3. U. Feldman, I. E. Dammasch, K. Wilhelm, P. Lemaire, and D. M. Hassler, "Images of the solar upper atmosphere from SUMER on SOHO," ESA publication SP-1274 (2003).
4. D. L. Windt, "IMD-software for modeling the optical properties of multilayer films.'' Computers in Physics 12, 360 (1998).
5. D. F. Edwards, ''Silicon (Si)," in Handbook of Optical Constants of solids, E. D. Palik, eds., P. 654 (Academic, 1985).
6. H. P. Philipp, ''Silicon Dioxide (SiO2) (glass)," in Handbook of Optical Constants of solids, E. D. Palik, eds., P. 749 (Academic, 1985).
7. B. L. Henke, E. M. Gullikson, and J.C. Davis, "X-ray interactions: photoabsorption, scattering, transmission and reflection at E = 50-30,000 eV, Z =1-92," At. Data Nucl. Data Tables 54, 183 (1993). See also at http://www-cxro.lbi.gov/optical_constants.
8. D. L. Windt, J. F. Seely, B. Kjornrattanawanich, and Y. A. Uspenskii, "Terbium-based extreme ultraviolet multilayers," Opt. Lett. 30, 3186 (2005).
9. B. Kjornrattanawanich, D. L. Windt, J. F. Seely, and Y. A. Uspenskii, "SiC/Tb and Si/Tb multilayer coatings for extreme ultraviolet solar imaging," Appl. Opt. 45, 1765 (2006).