Coated photodiode technique for the determination of the optical constants of reactive elements: La and Tb

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6317, Issue , 2006, Pages

  Seely, John F ^a   Uspenskii, Yurii A ^b   Kjornrattanawanich, Benjawan ^c   Windt, David L ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Reflective X ray Optics   (United States)

Author keywords

Extreme ultraviolet; La; Optical constants; Ta

Indexed keywords

EXTREME ULTRAVIOLET; OPTICAL CONSTANTS; PROTECTIVE CAPPING; RADIATION SOURCES;

LANTHANUM; OPTICAL PROPERTIES; OXIDATION; PROTECTIVE COATINGS; REFLECTION; TELESCOPES; TERBIUM; THIN FILMS; TRANSITION METALS;

PHOTODIODES;

EID: 33750595647     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.683234     Document Type: Conference Paper

References (11)

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