Mapping nanoscale wear field by combined atomic force microscopy and digital image correlation techniques

Acta Materialia

Volumn 56, Issue 20, 2008, Pages 6304-6309

  Xu, Zhi Hui ^a   Sutton, Michael A ^a   Li, Xiaodong ^a  

^a University of South Carolina   (United States)

Author keywords

Atomic force microscopy; Digital image correlation; Nanoscale wear

Indexed keywords

ABS RESINS; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; COATING TECHNIQUES; COATINGS; CONFORMAL MAPPING; DIGITAL ARITHMETIC; DIGITAL IMAGE STORAGE; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PROTECTIVE COATINGS; SCANNING PROBE MICROSCOPY; STRAIN MEASUREMENT;

ATOMIC FORCES; CORRELATION COEFFICIENTS; DIGITAL IMAGE CORRELATION; DIGITAL IMAGE CORRELATION TECHNIQUES; DIGITAL IMAGE CORRELATIONS; GOLD COATINGS; LINEAR RELATIONS; LOW LOADS; MATERIAL REMOVALS; NANO CONTACTS; NANOSCALE WEAR; NANOSCALE WEARS; SURFACE WEARS; THIN COATINGS; TOPOGRAPHICAL IMAGES; WEAR DEPTHS;

CORRELATION METHODS;

EID: 55949114386     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.08.044     Document Type: Article

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