In situ observation of nano-abrasive wear

Wear

Volumn 263, Issue 7-12 SPEC. ISS., 2007, Pages 1556-1559

  Ribeiro, R ^a   Shan, Z ^b   Minor, A M ^b   Liang, H ^a  

^a Texas A and M University   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

In situ observation; Nano abrasive wear; Nano sliding; Ploughing; Transmission electron microscopy; Voids formation

Indexed keywords

ABRASIVES; DIAMONDS; NANOINDENTATION; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY ANALYSIS; NANO ABRASIVE WEAR; VOIDS FORMATION;

WEAR OF MATERIALS;

ABRASIVES; DIAMONDS; NANOINDENTATION; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; WEAR OF MATERIALS;

EID: 34548026287     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2006.10.026     Document Type: Article

References (28)

1. H. Hertz, in: Jones, Schott (Eds.), On the Contract of Elastic Solids, 90, Miscellaneous Papers, Macmillan, London, 1896, p. 243.
2. H. Hertz, in: Jones, Schott (Eds.), On the Contract of Elastic Solids and on Hardness, 90, Miscellaneous Papers, Macmillan, London, 1896, p.156.
3. Archard J.F. Contact and rubbing of flat surfaces. J. Appl. Phys. 24 8 (1953, Aug) 981-988
4. Jahanmir S., and Suh N.P. Mechanics of subsurface void nucleation in delamination wear. Wear 44 (1977) 17-38
5. Johnson K.L. Surface interaction between elastically loaded bodies under tangential forces. Proc. R. Soc. A230 (1955) 531
6. Gerberich W.W., Benkataraman S.K., Hung H., Harvey S.E., and Kohlstedt D.L. The injection of plasticity by milliNewton contacts. Acta Metall. Mater. 43 (1995) 1569-1576
7. T. Kizuka, Direct atomic TEM observation of AFM tip-surface interaction, in: Proceedings of the 38th Japan Vacuum Soc. Meeting, January 10, 1998.
8. Minor A.M., Morris Jr. J.W., and Stach E.A. Appl. Phys. Lett. 79 (2001) 1625
9. Stach E.A., Freeman T., Minor A.M., Owen D.K., Cummings J., Wall M.A., Chraska T., Hull R., Morris Jr. J.W., Zettl A., and Dahmen U. Microsc. Microanal. 7 (2001) 507
10. Goodfellow catalog.
11. Marcus Materials Co. catalog.
12. Inglis C.E. Trans. Inst. Naval Architects 55 (1913) 219
13. Archard J.F. Contact and rubbing of flat surfaces. J. Appl. Phys. 24 8 (1953) 981-988
14. Kayaba T., and Kato K. Adhesive transfer of the slip-tongue and the wedge. ASLE Trans. 24 (1981) 164-174
15. Hokkirigawa K., and Kato K. An experimental and theoretical investigation of ploughing, cutting and wedge formation during abrasive wear. Tribol. Int. 21 (1988) 51-57
16. Schuh C.A., Mason J.K., and Lund A.C. Quantitative insight into dislocation nucleation from high-temperature nanoindentation experiments. Nat. Mater. 4 (2005) 617-621
17. Yoon S.Y., Oh J.Y., Kim C.O., and Jang J. Low temperature solid phase crystallization of amorphous silicon at 380 °C. J. App. Phys. 84 11 (1998) 6463-6465
18. Gogotsi Y., Zhou G., Ku S.S., and Cetinkunt S. Raman microscopectroscopy analysis of pressure-induced metallization in scratching of silicon. Semicond. Sci. Technol. 16 (2001) 345-352
19. Gogotsi Y., Baek C., and Kirscht F. Raman microspectroscopy study of processing-induced phase transformations and residual stress in silicon. Semicond. Sci. Technol. 14 (1999) 936-944
20. Kailer A., Nickel K.G., and Gogotsi Y.G. Raman microscopectroscopy of nanocrystalline and amorphous phases in hardness indentation. J. Raman Spectrosc. 30 (1999) 939-946
21. Hubbard C.R., Swanson H.E., and Mauer F.A. J. Appl. Crystallogr. 8 (1975) 45
22. Khayyat M.M., Hasko D.G., and Chaudhri M.M. Raman microscopy investigations and electrical characterization of indentation-induced phase transformation in silicon. Mater. Sci. Forum 480-481 (2005) 225-230
23. Bradby J.E., Williams J.S., Wong-Leung J., Swain M.V., and Munroe P. Mechanical deformation in silicon by micro-indentation. J. Mater. Res. 16 5 (2001) 1500-1505
24. Ho S.T., Chang Y.H., and Lin H.N. Conducting atomic force microscope study of phase transformation in silicon nanoindentation. J. Appl. Phys. 96 6 (2004) 3562-3564
25. Jeong S.M., Oh H.S., Park S.E., and Lee H.L. Phase transformation of single crystalline silicon by scratching. Jpn. J. Appl. Phys. 42 (2003) 2773-2774
26. Zarudi I., Nguyen T., and Zhang L.C. Effect of temperature and stress on plastic deformation in monocrystalline silicon induced by scratching. Appl. Phys. Lett. 86 (2005) 011922-011923
27. Durandurdu M., and Drabold D.A. High-pressure phases of amorphous and crystalline silicon. Phy. Rev. B 67 (2003) 212101-212103
28. Domnich V., and Gogotsi Y. Effect of phase transformation on the shape of the unloading curve in the nanoindentation of silicon. App. Phys. Lett. 76 16 (2000) 2214-2216