Particle size determination using TEM: A discussion of image acquisition and analysis for the novice microscopist

Langmuir

Volumn 24, Issue 20, 2008, Pages 11350-11360

  Pyrz, William D ^a   Buttrey, Douglas J ^a  

^a University of Delaware   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS METHODS; CRITICAL DECISIONS; DARK FIELDS; ELECTRON BEAM DAMAGES; MEASUREMENT RESOLUTIONS; NANOPARTICLE CHARACTERIZATIONS; NANOPARTICLE SIZE DISTRIBUTIONS; NANOPARTICLE SYNTHESES; SINGLE ATOMS; STATISTICAL EFFECTS; SUBSEQUENT ANALYSES;

ARSENIC; ELECTRON BEAMS; IMAGE ACQUISITION; MICROSCOPIC EXAMINATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SIZE DISTRIBUTION;

PARTICLE SIZE ANALYSIS;

EID: 55549091404     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la801367j     Document Type: Article

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