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Volumn 93, Issue 16, 2008, Pages

Native defects and their effects on properties of sputtered InN films

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DENSITY; ELECTRIC PROPERTIES; INDIUM; MAGNETRON SPUTTERING; NITROGEN; PHOTOELECTRON SPECTROSCOPY; WEAR RESISTANCE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 54949154109     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3003865     Document Type: Article
Times cited : (14)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.