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Physica Status Solidi (B) Basic Research

Volumn 245, Issue 9, 2008, Pages 1865-1876

The determination of charge-carrier lifetime in silicon

(3) Klein, D a Wuensch, F a Kunst, M a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54949114706 PISSN: 03701972 EISSN: 15213951 Source Type: Journal
DOI: 10.1002/pssb.200879544 Document Type: Article

Times cited : (18)

References (51)

1
- 0004071496
- Wiley Interscience, New York
- D. K. Schroder, Semiconductor Material and Device Characterization (Wiley Interscience, New York, 1990), p. 359-447.
- (1990) Semiconductor Material and Device Characterization , pp. 359-447
- Schroder, D.K.¹

2
- 0004052504
- Academic Press, Oxford
- J. W. Orton and P. Blood, The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties (Academic Press, Oxford, 1990).
- (1990) The Electrical Characterization of Semiconductors: Measurement of Minority Carrier Properties
- Orton, J.W.¹ Blood, P.²

3
- 0001209875
- M. van Exter and D. Grischkowski, Appl. Phys. Lett. 66, 1694 (1990).
- (1990) Appl. Phys. Lett , vol.66 , pp. 1694
- van Exter, M.¹ Grischkowski, D.²

4
- 0030084548
- A. Schönecker, J. A. Eikelboom, A. R. Burgers, P. Lölgen, C. Leguijt, and W. C. Sinke, J. Appl. Phys. 79, 1497 (1996).
- (1996) J. Appl. Phys , vol.79 , pp. 1497
- Schönecker, A.¹ Eikelboom, J.A.² Burgers, A.R.³ Lölgen, P.⁴ Leguijt, C.⁵ Sinke, W.C.⁶

5
- 0001645826
- H. J. G. Meyer, Phys. Rev. 112, 298 (1958).
- (1958) Phys. Rev , vol.112 , pp. 298
- Meyer, H.J.G.¹

6
- 0024106561
- V. Lehmann and H. Föll, J. Electrochem. Soc. 135, 2831 (1988).
- (1988) J. Electrochem. Soc , vol.135 , pp. 2831
- Lehmann, V.¹ Föll, H.²

7
- 9744268902
- T. Trupke and R. A. Bardos, Appl. Phys. Lett. 85, 3611 (2004).
- (2004) Appl. Phys. Lett , vol.85 , pp. 3611
- Trupke, T.¹ Bardos, R.A.²

8
- 0029277542
- P. Grunow and M. Kunst, J. Appl. Phys. 77, 2767 (1995).
- (1995) J. Appl. Phys , vol.77 , pp. 2767
- Grunow, P.¹ Kunst, M.²

9
- 0020748719
- T. Tiedje, J. I. Habermann, R. W. Francis, and A. K. Ghosh, J. Appl. Phys. 54, 2499 (1983).
- (1983) J. Appl. Phys , vol.54 , pp. 2499
- Tiedje, T.¹ Habermann, J.I.² Francis, R.W.³ Ghosh, A.K.⁴

10
- 0026839159
- E. Yablonovitch and T. J. Gmitter, Solid State Electron. 35, 261 (1992).
- (1992) Solid State Electron , vol.35 , pp. 261
- Yablonovitch, E.¹ Gmitter, T.J.²

11
- 54949109527
- Washington, 13-17 May
- R. A. Sinton, A. Cuevas, and M. Stuckings, 25th PVSC, Washington, 13-17 May 1996, p. 457.
- (1996) 25th PVSC , pp. 457
- Sinton, R.A.¹ Cuevas, A.² Stuckings, M.³

12
- 36549095754
- M. Kunst and G. Beck, J. Appl. Phys. 60, 3558 (1986).
- (1986) J. Appl. Phys , vol.60 , pp. 3558
- Kunst, M.¹ Beck, G.²

13
- 46749143375
- K. R. McIntosh, J.-H. Guo, M. D. Abbott, and R. A. Bardos, Prog. Photovolt. Res. Appl. 16, 279 (2008).
- (2008) Prog. Photovolt. Res. Appl , vol.16 , pp. 279
- McIntosh, K.R.¹ Guo, J.-H.² Abbott, M.D.³ Bardos, R.A.⁴

14
- 44149103855
- R. K. Ahrenkiel and S. W. Johnston, Sol. Energ. Mater. Sol. Cells 92, 830 (2008).
- (2008) Sol. Energ. Mater. Sol. Cells , vol.92 , pp. 830
- Ahrenkiel, R.K.¹ Johnston, S.W.²

15
- 0042431978
- R. K. Ahrenkiel and S. W. Johnston, Mater. Sci. Eng. B 102, 161 (2003).
- (2003) Mater. Sci. Eng. B , vol.102 , pp. 161
- Ahrenkiel, R.K.¹ Johnston, S.W.²

16
- 0012791097
- M. Kunst and G. Beck, J. Appl. Phys. 63, 1093 (1988).
- (1988) J. Appl. Phys , vol.63 , pp. 1093
- Kunst, M.¹ Beck, G.²

17
- 0343557383
- C. Swiatkowski, A. Sanders, K.-D. Buhre, and M. Kunst, J. Appl. Phys. 78, 1763 (1995).
- (1995) J. Appl. Phys , vol.78 , pp. 1763
- Swiatkowski, C.¹ Sanders, A.² Buhre, K.-D.³ Kunst, M.⁴

18
- 0027539536
- T. Otaredian, Solid-State Electron. 36, 163 (1993).
- (1993) Solid-State Electron , vol.36 , pp. 163
- Otaredian, T.¹

19
- 0000066852
- M. Schöfthaler and R. Brendel, J. Appl. Phys. 77, 3162 (1995).
- (1995) J. Appl. Phys , vol.77 , pp. 3162
- Schöfthaler, M.¹ Brendel, R.²

20
- 54949086847
- R. A. Sinton and A. Cuevas, Appl. Phys. Lett. 69, 457 (1996).
- (1996) Appl. Phys. Lett , vol.69 , pp. 457
- Sinton, R.A.¹ Cuevas, A.²

21
- 0031276081
- R. Schieck and M. Kunst, Solid-State Electron. 41, 1755 (1997).
- (1997) Solid-State Electron , vol.41 , pp. 1755
- Schieck, R.¹ Kunst, M.²

22
- 0030087214
- A. G. Aberle, J. Schmidt, and R. Brendel, J. Appl. Phys. 79, 1491 (1996).
- A. G. Aberle, J. Schmidt, and R. Brendel, J. Appl. Phys. 79, 1491 (1996).

23
- 0033356030
- J. Schmidt, IEEE Trans. Electron. Devices 46, 2018 (1999).
- (1999) IEEE Trans. Electron. Devices , vol.46 , pp. 2018
- Schmidt, J.¹

24
- 84944483089
- W. van Roosbroeck, Bell Syst. J. 29, 560 (1950).
- (1950) , vol.29 , Issue.560
- van Roosbroeck, W.¹ Bell Syst, J.²

25
- 0000612857
- H. Nagel, C. Berge, and A. C. Aberle, J. Appl. Phys. 86, 6218 (1999).
- (1999) J. Appl. Phys , vol.86 , pp. 6218
- Nagel, H.¹ Berge, C.² Aberle, A.C.³

26
- 54949101271
- Shaker Verlag, Aachen
- R. Schieck, Untersuchung der Ladungsträgerkinetik in Siliziumgrenzflächen mittels kontaktloser Verfahren (Shaker Verlag, Aachen, 1998).
- (1998) Untersuchung der Ladungsträgerkinetik in Siliziumgrenzflächen mittels kontaktloser Verfahren
- Schieck, R.¹

27
- 0000220982
- P. P. Altermatt, J. Schmidt, G. Heiser, and A. G. Aberle, J. Appl. Phys. 82, 4938 (1997).
- (1997) J. Appl. Phys , vol.82 , pp. 4938
- Altermatt, P.P.¹ Schmidt, J.² Heiser, G.³ Aberle, A.G.⁴

28
- 0012577224
- J. Schmidt, M. Kerr, and P. P. Altermatt, J. Appl. Phys. 88, 1494 (2000).
- (2000) J. Appl. Phys , vol.88 , pp. 1494
- Schmidt, J.¹ Kerr, M.² Altermatt, P.P.³

29
- 36149004075
- R. N. Hall, Phys. Rev. 87, 387 (1952).
- (1952) Phys. Rev , vol.87 , pp. 387
- Hall, R.N.¹

30
- 33748621800
- W. Shockley and W. T. Read, Phys. Rev. 87, 835 (1952).
- (1952) Phys. Rev , vol.87 , pp. 835
- Shockley, W.¹ Read, W.T.²

31
- 0032615132
- O. Hahneiser and M. Kunst, J. Appl. Phys. 85, 7741 (1999).
- (1999) J. Appl. Phys , vol.85 , pp. 7741
- Hahneiser, O.¹ Kunst, M.²

32
- 0003795709
- Birkhäuser, Boston
- J.-N. Chazalviel, Coulomb Screening by Mobile Charges (Birkhäuser, Boston, 1998), p. 201-238.
- (1998) Coulomb Screening by Mobile Charges , pp. 201-238
- Chazalviel, J.-N.¹

33
- 0004240297
- Masson, Paris
- H. Mathieu, Physique des semiconducteurs et des composants electroniques (Masson, Paris, 1987), p. 433-442.
- (1987) Physique des semiconducteurs et des composants electroniques , pp. 433-442
- Mathieu, H.¹

34
- 4243443351
- Ellipses, Paris
- B. Sapoval and C. Hermann, Physique des semiconducteurs (Ellipses, Paris, 1990), p. 167-172.
- (1990) Physique des semiconducteurs , pp. 167-172
- Sapoval, B.¹ Hermann, C.²

35
- 0024030427
- M. Kunst, G. Müller, R. Schmidt, and H. Wetzel, Appl. Phys. A, Solid Surf. 46, 77 (1988).
- (1988) Appl. Phys. A, Solid Surf , vol.46 , pp. 77
- Kunst, M.¹ Müller, G.² Schmidt, R.³ Wetzel, H.⁴

36
- 36549096341
- K. L. Luke and L. J. Cheng, J. Appl. Phys. 61, 2282 (1987).
- (1987) J. Appl. Phys , vol.61 , pp. 2282
- Luke, K.L.¹ Cheng, L.J.²

37
- 0026222790
- A. Sanders and M. Kunst, Solid-State Electron. 34, 1007 (1991).
- (1991) Solid-State Electron , vol.34 , pp. 1007
- Sanders, A.¹ Kunst, M.²

38
- 0026624498
- M. Kunst and A. Sanders, Semicond. Sci. Technol. 7, 51 (1992).
- (1992) Semicond. Sci. Technol , vol.7 , pp. 51
- Kunst, M.¹ Sanders, A.²

39
- 0023961305
- R. B. M. Girisch, R. P. Mertens, and R. F. de Keersmaecker, IEEE Trans. Electron. Devices 35, 203 (1998).
- (1998) IEEE Trans. Electron. Devices , vol.35 , pp. 203
- Girisch, R.B.M.¹ Mertens, R.P.² de Keersmaecker, R.F.³

40
- 21544445512
- A. G. Aberle, S. Glunz, and W. Warta, J. Appl. Phys. 71, 4422 (1992).
- (1992) J. Appl. Phys , vol.71 , pp. 4422
- Aberle, A.G.¹ Glunz, S.² Warta, W.³

41
- 36149020606
- D. J. Sandiford, Phys. Rev. 105, 524 (1957).
- (1957) Phys. Rev , vol.105 , pp. 524
- Sandiford, D.J.¹

42
- 36149015022
- G. K. Wertheim, Phys. Rev. 109, 1086 (1958).
- (1958) Phys. Rev , vol.109 , pp. 1086
- Wertheim, G.K.¹

43
- 33644665522
- Springer, Berlin
- S. Rein, Lifetime Spectroscopy (Springer, Berlin, 2005).
- (2005) Lifetime Spectroscopy
- Rein, S.¹

44
- 0036607918
- S. von Aichberger, O. Abdallah, F. Wünsch, and M. Kunst, J. Appl. Phys. 91, 9147 (2002).
- (2002) J. Appl. Phys , vol.91 , pp. 9147
- von Aichberger, S.¹ Abdallah, O.² Wünsch, F.³ Kunst, M.⁴

45
- 21544447469
- R. Hezel and R. Schroner, J. Appl. Phys. 52, 3076 (1981).
- (1981) J. Appl. Phys , vol.52 , pp. 3076
- Hezel, R.¹ Schroner, R.²

46
- 0000388939
- J. R. Elmiger and M. Kunst, Appl. Phys. Lett. 69, 517 (1996).
- (1996) Appl. Phys. Lett , vol.69 , pp. 517
- Elmiger, J.R.¹ Kunst, M.²

47
- 0028407942
- K. Watanabe, Semicond. Sci. Technol. 9, 370 (1994).
- (1994) Semicond. Sci. Technol , vol.9 , pp. 370
- Watanabe, K.¹

48
- 54949088737
- M. Bail, M. Schulz, and R. Brendel, Appl. Phys. Lett. 62, 75 (2003).
- (2003) Appl. Phys. Lett , vol.62 , pp. 75
- Bail, M.¹ Schulz, M.² Brendel, R.³

49
- 54949150743
- Ph.D. thesis, University of New South Wales, Australia
- D. H. Neuhaus, Ph.D. thesis, University of New South Wales, Australia (2002).
- (2002)
- Neuhaus, D.H.¹

50
- 1542306857
- P. J. Cousins, D. H. Neuhaus, and J. E. Cotter, J. Appl. Phys. 95, 1854 (2004).
- (2004) J. Appl. Phys , vol.95 , pp. 1854
- Cousins, P.J.¹ Neuhaus, D.H.² Cotter, J.E.³

51
- 2942625960
- M. Kunst and P. Grunow, Sol. Energy Mater. Sol. Cells 83, 409 (2004).
- (2004) Sol. Energy Mater. Sol. Cells , vol.83 , pp. 409
- Kunst, M.¹ Grunow, P.²

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