Measurement of differential and actual recombination parameters on crystalline silicon wafers

IEEE Transactions on Electron Devices

Volumn 46, Issue 10, 1999, Pages 2018-2025

  Schmidt, Jan ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CONTACTS; ELECTRIC VARIABLES MEASUREMENT; INTERFACES (MATERIALS); PERMITTIVITY; PHOTOVOLTAIC CELLS; SILICA; SILICON SOLAR CELLS; SILICON WAFERS;

AUGER LIFETIME; MICROWAVE DETECTED PHOTOCONDUCTANCE DECAY; MODULATED FREE CARRIER ABSORPTION; QUASI STEADY STATE PHOTOCONDUCTANCE; SURFACE RECOMBINATION VELOCITY;

CHARGE CARRIERS;

EID: 0033356030     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.791991     Document Type: Article

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