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Volumn 83, Issue 4, 2004, Pages 409-419
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Characterization of multicrystalline silicon wafers by non-invasive measurements
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Author keywords
Carrier lifetime; Multicrystalline silicon; Solar cells
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Indexed keywords
CHARGE CARRIERS;
COSTS;
CRYSTALLINE MATERIALS;
ENERGY EFFICIENCY;
GRAIN SIZE AND SHAPE;
HEAT SINKS;
PHOTOCONDUCTIVITY;
SOLAR CELLS;
CARRIER LIFETIME;
MULTICRYSTALLINE SILICON;
SURFACE RECOMBINATION;
SILICON WAFERS;
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EID: 2942625960
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2004.01.034 Document Type: Article |
Times cited : (7)
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References (12)
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