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Volumn 13, Issue 4, 2007, Pages 163-168

Atomic layer deposition of titanium disulfide thin films

Author keywords

ALD; FESEM; Layered transition metal dichalcogenides; Thin films; Titanium disulfide

Indexed keywords

ALUMINA; ATOMIC PHYSICS; ATOMS; CRYSTALLOGRAPHY; GLASS; IRIDIUM; PALLADIUM; PHYSICAL VAPOR DEPOSITION; PLATINUM; PRECIOUS METALS; PULSED LASER DEPOSITION; RHODIUM; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SOLIDS; THICK FILMS; THIN FILMS; TIN; TITANIUM; TITANIUM COMPOUNDS; TITANIUM NITRIDE; TRANSITION METALS; ZINC SULFIDE;

EID: 54949098933     PISSN: 09481907     EISSN: 15213862     Source Type: Journal    
DOI: 10.1002/cvde.200606530     Document Type: Article
Times cited : (40)

References (40)
  • 12
  • 27
    • 54949153581 scopus 로고    scopus 로고
    • International Centre for Diffraction Data ICDD
    • International Centre for Diffraction Data (ICDD), Card 15-0853.
    • Card 15-0853
  • 28
    • 54949088466 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Helsinki
    • T. Aaltonen, Ph.D. Thesis, University of Helsinki 2005.
    • (2005)
    • Aaltonen, T.1
  • 33
    • 54949150085 scopus 로고    scopus 로고
    • International Centre for Diffraction Data ICDD
    • International Centre for Diffraction Data (ICDD), Card 25-1234.
    • Card 25-1234
  • 35
    • 54949103000 scopus 로고    scopus 로고
    • International Centre for Diffraction Data ICDD
    • International Centre for Diffraction Data (ICDD), Card 36-1406.
    • Card 36-1406
  • 36
    • 34247237142 scopus 로고    scopus 로고
    • International Centre for Diffraction Data ICDD
    • International Centre for Diffraction Data (ICDD), Card 21-1272.
    • Card 21-1272


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.