메뉴 건너뛰기




Volumn , Issue , 2008, Pages 482-491

A characterization of instruction-level error derating and its implications for error detection

Author keywords

Dual modular redundancy; Error detection; Fault injection; Instruction level derating; Software derating

Indexed keywords

DUAL MODULAR REDUNDANCY; FAULT INJECTION; INSTRUCTION-LEVEL DERATING; SOFTWARE DERATING;

EID: 53349095714     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSN.2008.4630119     Document Type: Conference Paper
Times cited : (42)

References (28)
  • 1
    • 53349152753 scopus 로고    scopus 로고
    • The LLVM Compiler Infrastructure. Home page
    • The LLVM Compiler Infrastructure. Home page: http://llvm.cs.uiuc.edu/.
  • 2
    • 0036469652 scopus 로고    scopus 로고
    • Simplescalar: An infrastructure for computer system modeling
    • Feb
    • T. Austin, E. Larson, and D. Ernst. Simplescalar: An infrastructure for computer system modeling. IEEE Computer, 35(2):59-67, Feb. 2002.
    • (2002) IEEE Computer , vol.35 , Issue.2 , pp. 59-67
    • Austin, T.1    Larson, E.2    Ernst, D.3
  • 3
    • 0033321638 scopus 로고    scopus 로고
    • DIVA: A reliable substrate for deep submicron microarchitecture design
    • T. M. Austin. DIVA: A reliable substrate for deep submicron microarchitecture design. In Proc. of the Intl. Symp. on Microarchitecture, pages 196-207, 1999.
    • (1999) Proc. of the Intl. Symp. on Microarchitecture , pp. 196-207
    • Austin, T.M.1
  • 5
    • 0041633858 scopus 로고    scopus 로고
    • Parameter variations and impact on circuits and microarchitecture
    • S. Borkar et al. Parameter variations and impact on circuits and microarchitecture. In Proc. of the Annual Conf. on Design Automation, pages 338-342, 2003.
    • (2003) Proc. of the Annual Conf. on Design Automation , pp. 338-342
    • Borkar, S.1
  • 7
    • 0030286383 scopus 로고    scopus 로고
    • A gate-level simulation environment for alpha-particle-induced transient faults
    • Nov
    • H. Cha, E. M. Rudnick, J. H. Patel, R. K. Iyer, and G. S. Choi. A gate-level simulation environment for alpha-particle-induced transient faults. IEEE Trans. on Computers, 45(11):1248-1256, Nov. 1996.
    • (1996) IEEE Trans. on Computers , vol.45 , Issue.11 , pp. 1248-1256
    • Cha, H.1    Rudnick, E.M.2    Patel, J.H.3    Iyer, R.K.4    Choi, G.S.5
  • 14
    • 0029256045 scopus 로고
    • FERRARI: A flexible software-based fault and error injection system
    • Feb
    • G. A. Kanawati, N. A. Kanawati, and J. A. Abraham. FERRARI: A flexible software-based fault and error injection system. IEEE Trans. on Computers, 44(2):248-260, Feb. 1995.
    • (1995) IEEE Trans. on Computers , vol.44 , Issue.2 , pp. 248-260
    • Kanawati, G.A.1    Kanawati, N.A.2    Abraham, J.A.3
  • 18
    • 15044363155 scopus 로고    scopus 로고
    • Robust system design with built-in soft-error resilience
    • Feb
    • S. Mitra, N. Seifert, M. Zhang, Q. Shi, and K. S. Kim. Robust system design with built-in soft-error resilience. IEEE Computer, 38(2):43-52, Feb. 2005.
    • (2005) IEEE Computer , vol.38 , Issue.2 , pp. 43-52
    • Mitra, S.1    Seifert, N.2    Zhang, M.3    Shi, Q.4    Kim, K.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.