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Volumn 78, Issue 12, 2008, Pages

Charge noise in single-electron transistors and charge qubits may be caused by metallic grains

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EID: 52949117181     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.125411     Document Type: Article
Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.