Noise in Al single electron transistors of stacked design

Journal of Applied Physics

Volumn 84, Issue 6, 1998, Pages 3212-3215

  Krupenin, V A ^a   Presnov, D E ^a   Savvateev, M N ^a   Scherer, H ^b   Zorin, A B ^b   Niemeyer, J ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001037165     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368474     Document Type: Article

References (22)

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