Measurement of the excited-state lifetime of a microelectronic circuit

Physical Review Letters

Volumn 90, Issue 2, 2003, Pages

  Lehnert, K W ^a   Bladh, K ^b   Spietz, L F ^a   Gunnarsson, D ^b   Schuster, D I ^a   Delsing, P ^b   Schoelkopf, R J ^a  

^a YALE UNIVERSITY   (United States)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); EXCITONS; HAMILTONIANS; RESONANCE; SPONTANEOUS EMISSION; SUPERCONDUCTIVITY; TRANSISTORS;

COOPER PAIR BOX; EXCITED STATE LIFETIME; SINGLE ELECTRON TRANSISTOR;

QUANTUM ELECTRONICS;

EID: 0037449899     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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