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Volumn , Issue , 2008, Pages

Thermo-mechanical design of large die fine pitch copper/low-k FCBGA and lead-free interconnections

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHIP SCALE PACKAGES; COPPER; COPPER ALLOYS; DIES; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; FORMING; LIGHT METALS; MATERIALS SCIENCE; NITRIDES; NONMETALS; PASSIVATION; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR MATERIALS; SILICA; SILICON NITRIDE; SPEED; TECHNOLOGY; THERMOMECHANICAL TREATMENT; TWO DIMENSIONAL;

EID: 52449123686     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2008.4606992     Document Type: Conference Paper
Times cited : (2)

References (15)
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    • Chungpaiboonpatana, S.1    Shi, F.G.2
  • 3
    • 0037674766 scopus 로고    scopus 로고
    • Effect of Packaging on Interfacial Cracking in Cu/ Low k Damascene Structures
    • Guotao Wang, Steven Groothuis and Paul S. Ho, "Effect of Packaging on Interfacial Cracking in Cu/ Low k Damascene Structures" Proc. of ECTC, 2003, pp. 727-732.
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    • Wang, G.1    Groothuis, S.2    Ho, P.S.3
  • 7
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    • Comprehensive Analysis of A Larger Die, Copper Pillar Bump Flip Chip Package with No-Flow Underfill
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  • 8
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  • 9
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    • Absolute and Relative Fatigue Life Prediction Methodology for Virtual Qualification and Design Enhancement of Lead-free BGA
    • USA
    • HS Ng, TY Tee, et al, "Absolute and Relative Fatigue Life Prediction Methodology for Virtual Qualification and Design Enhancement of Lead-free BGA," Proc. of 55thECTC, USA, 2005, pp. 1282-1291.
    • (2005) Proc. of 55thECTC , pp. 1282-1291
    • Ng, H.S.1    Tee, T.Y.2
  • 10
    • 33947240835 scopus 로고    scopus 로고
    • Deformation Characteristics and Microstructural Evolution of SnAgCu Solder Joints
    • Germany, Apr
    • TO Reinikainen, et al, "Deformation Characteristics and Microstructural Evolution of SnAgCu Solder Joints," Proc. EuroSime Conference, Germany, Apr. 2005.
    • (2005) Proc. EuroSime Conference
    • Reinikainen, T.O.1
  • 12
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  • 13
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    • Seung Wook Yoon, David Wirtasa, Samuel Lim, V. Ganesh, Akella Viswanath, Vaidyanathan Kripesh and Mahadevan K. Iyer. PEDL (Polymer Encapsulated Dicing Line) Technology for Copper/Low-k Dielectrics Interconnect, 2005 Electronics Packaging Technology Conference, pp. 711-715.
    • Seung Wook Yoon, David Wirtasa, Samuel Lim, V. Ganesh, Akella Viswanath, Vaidyanathan Kripesh and Mahadevan K. Iyer. "PEDL (Polymer Encapsulated Dicing Line) Technology for Copper/Low-k Dielectrics Interconnect," 2005 Electronics Packaging Technology Conference, pp. 711-715.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.