메뉴 건너뛰기




Volumn 2, Issue , 2005, Pages 575-578

Comprehensive analysis of a larger die, copper pillar bump flip chip package with no-flow underfill

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARY FLOW; DIES; FLIP CHIP DEVICES; MOISTURE; STRESSES; THERMOMECHANICAL TREATMENT;

EID: 33847306990     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 1
    • 0039677908 scopus 로고    scopus 로고
    • The National Technology Roadmap for Semiconductors:, Semiconductor Industry Association
    • The National Technology Roadmap for Semiconductors: Technology Needs, Semiconductor Industry Association, 1997.
    • (1997) Technology Needs
  • 2
    • 85069071053 scopus 로고    scopus 로고
    • http://www.advancpack.com.
  • 3
    • 0030718912 scopus 로고    scopus 로고
    • High performance no-flow underfills for low-cost flip-chip applications
    • San Jose, CA, May 18-21
    • th ECTC, San Jose, CA, May 18-21, 1997, pp. 850-858.
    • (1997) th ECTC , pp. 850-858
    • Wong, C.P.1    Shi, S.H.2    Jefferson, G.3
  • 4
    • 0036545281 scopus 로고    scopus 로고
    • Assembly of lead-free bumped flip-chip with no-flow underfills
    • Apr
    • Z. Zhang and C. P. Wong, "Assembly of lead-free bumped flip-chip with no-flow underfills," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 25, No. 2, Apr. 2002, pp. 113-119.
    • (2002) IEEE Transactions on Electronics Packaging Manufacturing , vol.25 , Issue.2 , pp. 113-119
    • Zhang, Z.1    Wong, C.P.2
  • 5
    • 0034998886 scopus 로고    scopus 로고
    • Moisture absorption in no-flow underfill materials and its effect on interfacial adhesion to solder mask coated FR4 print wiring board
    • T. P. Ferguson and J. Qu, "Moisture absorption in no-flow underfill materials and its effect on interfacial adhesion to solder mask coated FR4 print wiring board," in Proc. 2001 International Symposium on Advanced Packaging Materials, pp. 327-332.
    • Proc. 2001 International Symposium on Advanced Packaging Materials , pp. 327-332
    • Ferguson, T.P.1    Qu, J.2
  • 6
    • 0035301154 scopus 로고    scopus 로고
    • Yield analysis and process modeling of low cost, high throughput flip chip assembly based on no-flow underfilll materials
    • April
    • R. Thorpe, D. F. Baldwin, B. Smith and L. McGovern, "Yield analysis and process modeling of low cost, high throughput flip chip assembly based on no-flow underfilll materials," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 2, April 2001, pp. 123-135.
    • (2001) IEEE Transactions on Electronics Packaging Manufacturing , vol.24 , Issue.2 , pp. 123-135
    • Thorpe, R.1    Baldwin, D.F.2    Smith, B.3    McGovern, L.4
  • 7
    • 0038326650 scopus 로고    scopus 로고
    • Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill
    • T. Y. Tee, C. L. Kho, D. Yap, C. Toh, X. Baraton and Z. W. Zhong, "Reliability assessment and hygroswelling modeling of FCBGA with no-flow underfill," Microelectronics Reliability, Vol. 43, 2003, pp. 741-749.
    • (2003) Microelectronics Reliability , vol.43 , pp. 741-749
    • Tee, T.Y.1    Kho, C.L.2    Yap, D.3    Toh, C.4    Baraton, X.5    Zhong, Z.W.6
  • 9
    • 20344396091 scopus 로고    scopus 로고
    • Development of Process Modeling Methodology for Flip Chip on Flex Interconnections with Non-conductive Adhesive
    • July
    • X. Zhang, E. H. Wong, R. Rajoo, M. K. Iyer, J. F. J. M. Caere, X. J. Zhao, "Development of Process Modeling Methodology for Flip Chip on Flex Interconnections with Non-conductive Adhesive", Microelectronics Reliability, Vol. 45, July 2005, pp. 1215-1221.
    • (2005) Microelectronics Reliability , vol.45 , pp. 1215-1221
    • Zhang, X.1    Wong, E.H.2    Rajoo, R.3    Iyer, M.K.4    Caere, J.F.J.M.5    Zhao, X.J.6
  • 10
    • 0034948627 scopus 로고    scopus 로고
    • Adhesion characterization of no-flow underfillls used flip chip assemblies and correlation with relaibility
    • Jan
    • J. Lu, B. Smith and D. F. Baldwin, "Adhesion characterization of no-flow underfillls used flip chip assemblies and correlation with relaibility," IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 1, Jan 2001, pp. 26-30.
    • (2001) IEEE Transactions on Electronics Packaging Manufacturing , vol.24 , Issue.1 , pp. 26-30
    • Lu, J.1    Smith, B.2    Baldwin, D.F.3
  • 11
    • 0042878424 scopus 로고    scopus 로고
    • Characteristics and reliability of no-flow underfills for solder bumped flip chip assemblies
    • J. H. Lau, C. Chang and C-C. Chen, "Characteristics and reliability of no-flow underfills for solder bumped flip chip assemblies," Intl. Journal of Microcircuits and Electronic Packaging, Vol. 22, No. 4, 1999, pp. 370-381.
    • (1999) Intl. Journal of Microcircuits and Electronic Packaging , vol.22 , Issue.4 , pp. 370-381
    • Lau, J.H.1    Chang, C.2    Chen, C.-C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.