메뉴 건너뛰기




Volumn , Issue , 2004, Pages 105-108

Structural optimization of fine pitch, large die flip chip package

Author keywords

[No Author keywords available]

Indexed keywords

DIES; FLIP CHIP DEVICES; SHEAR STRESS; STRESS CONCENTRATION; SUBSTRATES; THERMOMECHANICAL TREATMENT;

EID: 28444467810     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (6)
  • 3
    • 0036881357 scopus 로고    scopus 로고
    • Computational parametric analysis of solder joint reliability of bottom leaded plastic (BLP) package
    • Zhang X, Ricky Lee S-W, Choi KS, Kim YG. Computational parametric analysis of solder joint reliability of bottom leaded plastic (BLP) package. IEEE Trans Advanced Packag Technol 2002;25(4):514-21.
    • (2002) IEEE Trans Advanced Packag Technol , vol.25 , Issue.4 , pp. 514-521
    • Zhang, X.1    Ricky Lee, S.-W.2    Choi, K.S.3    Kim, Y.G.4
  • 4
    • 0039896326 scopus 로고    scopus 로고
    • A damage evolution model for thermal fatigue of solder joints
    • Zhang X, Ricky Lee S-W, Pao Y-H. A damage evolution model for thermal fatigue of solder joints. ASME Trans: J Electron Packag 2000; 122(3):200-6.
    • (2000) ASME Trans: J Electron Packag , vol.122 , Issue.3 , pp. 200-206
    • Zhang, X.1    Ricky Lee, S.-W.2    Pao, Y.-H.3
  • 5
  • 6
    • 0035111766 scopus 로고    scopus 로고
    • The effects of bump height on the reliability of ACF in flip-chip
    • C.M.L.Wu, Johan Liu, N.H.Yeung, "The effects of bump height on the reliability of ACF in flip-chip", Soldering & Surface Mount Technology 13/1, 2001, pp 25-30.
    • (2001) Soldering & Surface Mount Technology , vol.13 , Issue.1 , pp. 25-30
    • Wu, C.M.L.1    Liu, J.2    Yeung, N.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.