Reliability in application specific mesh-based NoC architectures

Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008

Volumn , Issue , 2008, Pages 207-212

  Refan, Fatemeh ^a   Alemzadeh, Homa ^a   Safari, Saeed ^a   Prinetto, Paolo ^b   Navabi, Zainalabedin ^a  

^a UNIVERSITY OF TEHRAN   (Iran)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; DIGITAL COMMUNICATION SYSTEMS; ELECTRIC NETWORK TOPOLOGY; ELECTRONICS INDUSTRY; INTEGRATED CIRCUITS; NETWORKS (CIRCUITS); QUALITY ASSURANCE; RELIABILITY ANALYSIS; SWITCHES; TECHNOLOGY;

APPLICATION-SPECIFIC; COMMUNICATION CHANNELS; DIGITAL SYSTEMS; FAULT-TOLERANT; MESH-BASED NOC; NETWORKS ON CHIPS; NOC ARCHITECTURES; ON-LINE TESTING; POWER CONSUMPTION; RELIABILITY ANALYSIS METHOD; RELIABILITY MODELING; SELF REPAIRING;

RELIABILITY;

EID: 52049116492     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2008.53     Document Type: Conference Paper

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