NoC interconnect yield improvement using crosspoint redundancy

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2006, Pages 457-465

  Grecu, Cristian ^a   Ivanov, André ^a   Saleh, Res ^a   Pande, Partha Pratim ^b  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^b Washington State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; INTERCONNECTION NETWORKS; REDUNDANCY; TUNING; VLSI CIRCUITS;

COMPLEX COMMUNICATION FABRICS; INTERCONNECT INFRASTRUCTURES; MULTI CORE SYSTEMS;

MICROPROCESSOR CHIPS;

EID: 34250858209     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2006.46     Document Type: Conference Paper

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