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Volumn , Issue , 2004, Pages 5-11

Reliability and power management of integrated systems

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED SYSTEMS; POWER CONSUMPTION; POWER MANAGEMENT; SYSTEMS ON CHIP (SOC);

EID: 13944258113     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSD.2004.1333252     Document Type: Conference Paper
Times cited : (29)

References (29)
  • 1
    • 0036839166 scopus 로고    scopus 로고
    • Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate dioxides
    • E. Y. Wu et al. Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate dioxides. In Solid-state Electronics Journal, 2002.
    • (2002) Solid-state Electronics Journal
    • Wu, E.Y.1
  • 2
    • 0036149420 scopus 로고    scopus 로고
    • Networks on chips: A new SoC paradigm
    • Jan.
    • L. Benini, G. De Micheli, "Networks on Chips: A New SoC Paradigm," IEEE Computer, pp. 70-78, Jan. 2002.
    • (2002) IEEE Computer , pp. 70-78
    • Benini, L.1    De Micheli, G.2
  • 3
    • 84893687806 scopus 로고    scopus 로고
    • A generic architecture for on-chip packet switched interconnections
    • P. Guerrier, A. Greiner, "A Generic Architecture for on-chip packet switched interconnections," DATE, pp. 250-256, 2000.
    • (2000) DATE , pp. 250-256
    • Guerrier, P.1    Greiner, A.2
  • 4
    • 0037656855 scopus 로고    scopus 로고
    • A NOC architecture and design methodology
    • S. Kumar et al., "A NOC architecture and design methodology," ISVLSI, pp. 105-112, 2002.
    • (2002) ISVLSI , pp. 105-112
    • Kumar, S.1
  • 5
    • 84893753441 scopus 로고    scopus 로고
    • Trade-offs in the design of a router with both guaranteed and best-effort services for NOCs
    • E. Rijpkema et. al., "Trade-offs in the design of a router with both guaranteed and best-effort services for NOCs," DATE, pp. 350-355, 2003.
    • (2003) DATE , pp. 350-355
    • Rijpkema, E.1
  • 8
    • 0347284368 scopus 로고    scopus 로고
    • Analysis of power consumption on switch fabrics in network routers
    • T. Ye, L. Benini, G. De Micheli, "Analysis of Power Consumption on Switch Fabrics in Network Routers," Design Automation Conference, pp. 600-605, 2002.
    • (2002) Design Automation Conference , pp. 600-605
    • Ye, T.1    Benini, L.2    De Micheli, G.3
  • 10
    • 0017983601 scopus 로고
    • Performance-related reliability measures for computing systems
    • June
    • M. D. Beaudry. Performance-related reliability measures for computing systems. IEEE Transactions on Computers, c-27(6):540-547, June 1978.
    • (1978) IEEE Transactions on Computers , vol.C-27 , Issue.6 , pp. 540-547
    • Beaudry, M.D.1
  • 14
  • 15
    • 13944251955 scopus 로고    scopus 로고
    • Critical reliability challenges for the international technology roadmap for semiconductors
    • Critical Reliability Challenges for the International Technology roadmap for Semiconductors, International Sematech Technology Transfer document 03024377A-TR, 2003.
    • (2003) International Sematech Technology Transfer Document 03024377A-TR
  • 19
    • 0033314330 scopus 로고    scopus 로고
    • Ibm s/390 parallel enterprise server g5 fault tolerance: A historical perspective
    • September/November
    • L. Spainhower and T. A. Gregg. Ibm s/390 parallel enterprise server g5 fault tolerance: A historical perspective. In IBM Journal of Research and Development, September/November 1999.
    • (1999) IBM Journal of Research and Development
    • Spainhower, L.1    Gregg, T.A.2
  • 20
    • 33750941797 scopus 로고    scopus 로고
    • RAMP: A model for reliability aware microprocessor design
    • RC23048 (W0312-122) December 29
    • Jayanth Srinivasan, Santa V. Adve, Pradip Bose, Jude Rivers, Chao-Kun Hu, "RAMP: A Model for Reliability Aware Microprocessor Design,"IBM Research Report, RC23048 (W0312-122) December 29, 2003
    • (2003) IBM Research Report
    • Srinivasan, J.1    Adve, S.V.2    Bose, P.3    Rivers, J.4    Hu, C.-K.5
  • 24
    • 13944254281 scopus 로고    scopus 로고
    • Dynamic fault-tolerance management in failure-prone and battery-powered systems
    • Phillip Stanley-Marbell, Diana Marculescu, "Dynamic Fault-Tolerance Management in Failure-Prone and Battery-Powered Systems," IWSC?
    • IWSC?
    • Stanley-Marbell, P.1    Marculescu, D.2
  • 26
    • 3042522902 scopus 로고    scopus 로고
    • High-level system modeling and architecture exploration with SystemC on a NOC SoC: S3C2510 case study
    • H. Jang, M. Kang, M. Lee, K. Chae, K. Lee, K. Shim, "High-level system modeling and architecture exploration with SystemC on a NOC SoC: S3C2510 case study," DATE 2004.
    • DATE 2004
    • Jang, H.1    Kang, M.2    Lee, M.3    Chae, K.4    Lee, K.5    Shim, K.6
  • 27
  • 29
    • 13944252448 scopus 로고    scopus 로고
    • The impact of technology scaling on processor lifetime reliability
    • December
    • Jayanth Srinivasan, Pradip Bose, Jude Rivers, "The impact of Technology Scaling on Processor Lifetime Reliability," UIUC CS Technical Report UIUCDCS-R-2003-2398, December 2003
    • (2003) UIUC CS Technical Report , vol.UIUCDCS-R-2003-2398
    • Srinivasan, J.1    Bose, P.2    Rivers, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.