-
1
-
-
0036839166
-
Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate dioxides
-
E. Y. Wu et al. Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate dioxides. In Solid-state Electronics Journal, 2002.
-
(2002)
Solid-state Electronics Journal
-
-
Wu, E.Y.1
-
2
-
-
0036149420
-
Networks on chips: A new SoC paradigm
-
Jan.
-
L. Benini, G. De Micheli, "Networks on Chips: A New SoC Paradigm," IEEE Computer, pp. 70-78, Jan. 2002.
-
(2002)
IEEE Computer
, pp. 70-78
-
-
Benini, L.1
De Micheli, G.2
-
3
-
-
84893687806
-
A generic architecture for on-chip packet switched interconnections
-
P. Guerrier, A. Greiner, "A Generic Architecture for on-chip packet switched interconnections," DATE, pp. 250-256, 2000.
-
(2000)
DATE
, pp. 250-256
-
-
Guerrier, P.1
Greiner, A.2
-
4
-
-
0037656855
-
A NOC architecture and design methodology
-
S. Kumar et al., "A NOC architecture and design methodology," ISVLSI, pp. 105-112, 2002.
-
(2002)
ISVLSI
, pp. 105-112
-
-
Kumar, S.1
-
5
-
-
84893753441
-
Trade-offs in the design of a router with both guaranteed and best-effort services for NOCs
-
E. Rijpkema et. al., "Trade-offs in the design of a router with both guaranteed and best-effort services for NOCs," DATE, pp. 350-355, 2003.
-
(2003)
DATE
, pp. 350-355
-
-
Rijpkema, E.1
-
8
-
-
0347284368
-
Analysis of power consumption on switch fabrics in network routers
-
T. Ye, L. Benini, G. De Micheli, "Analysis of Power Consumption on Switch Fabrics in Network Routers," Design Automation Conference, pp. 600-605, 2002.
-
(2002)
Design Automation Conference
, pp. 600-605
-
-
Ye, T.1
Benini, L.2
De Micheli, G.3
-
9
-
-
1342273164
-
Design methodology of a low-energy reconfigurable single-chip DPS system
-
M. Wan, H. Zhang, V. George, M. Benes, A. Abnous, V. Prabhu, J. Rabaey, "Design Methodology of a Low-Energy Reconfigurable Single-Chip DPS System," Journal of VLSI Signal Processing, 2000.
-
(2000)
Journal of VLSI Signal Processing
-
-
Wan, M.1
Zhang, H.2
George, V.3
Benes, M.4
Abnous, A.5
Prabhu, V.6
Rabaey, J.7
-
10
-
-
0017983601
-
Performance-related reliability measures for computing systems
-
June
-
M. D. Beaudry. Performance-related reliability measures for computing systems. IEEE Transactions on Computers, c-27(6):540-547, June 1978.
-
(1978)
IEEE Transactions on Computers
, vol.C-27
, Issue.6
, pp. 540-547
-
-
Beaudry, M.D.1
-
13
-
-
84893719539
-
Managing power consumption in networks on chips
-
T. Simunic, S. Boyd, "Managing Power Consumption in Networks on Chips," Design, Automation and Test in Europe, pp. 110-116, 2002.
-
(2002)
Design, Automation and Test in Europe
, pp. 110-116
-
-
Simunic, T.1
Boyd, S.2
-
14
-
-
0032090154
-
Predicting MPEG execution times
-
A. Bavier, A. Montz, L. Peterson, "Predicting MPEG Execution Times," SIGMETRICS, pp.131-140, 1998.
-
(1998)
Sigmetrics
, pp. 131-140
-
-
Bavier, A.1
Montz, A.2
Peterson, L.3
-
15
-
-
13944251955
-
Critical reliability challenges for the international technology roadmap for semiconductors
-
Critical Reliability Challenges for the International Technology roadmap for Semiconductors, International Sematech Technology Transfer document 03024377A-TR, 2003.
-
(2003)
International Sematech Technology Transfer Document 03024377A-TR
-
-
-
16
-
-
0035398882
-
Event-driven power management
-
July
-
T. Simunic, L. Benini, P. Glynn, G. De Micheli, "Event-driven Power Management," IEEE Transactions on CAD, pp.840-857, July 2001
-
(2001)
IEEE Transactions on CAD
, pp. 840-857
-
-
Simunic, T.1
Benini, L.2
Glynn, P.3
De Micheli, G.4
-
19
-
-
0033314330
-
Ibm s/390 parallel enterprise server g5 fault tolerance: A historical perspective
-
September/November
-
L. Spainhower and T. A. Gregg. Ibm s/390 parallel enterprise server g5 fault tolerance: A historical perspective. In IBM Journal of Research and Development, September/November 1999.
-
(1999)
IBM Journal of Research and Development
-
-
Spainhower, L.1
Gregg, T.A.2
-
20
-
-
33750941797
-
RAMP: A model for reliability aware microprocessor design
-
RC23048 (W0312-122) December 29
-
Jayanth Srinivasan, Santa V. Adve, Pradip Bose, Jude Rivers, Chao-Kun Hu, "RAMP: A Model for Reliability Aware Microprocessor Design,"IBM Research Report, RC23048 (W0312-122) December 29, 2003
-
(2003)
IBM Research Report
-
-
Srinivasan, J.1
Adve, S.V.2
Bose, P.3
Rivers, J.4
Hu, C.-K.5
-
24
-
-
13944254281
-
Dynamic fault-tolerance management in failure-prone and battery-powered systems
-
Phillip Stanley-Marbell, Diana Marculescu, "Dynamic Fault-Tolerance Management in Failure-Prone and Battery-Powered Systems," IWSC?
-
IWSC?
-
-
Stanley-Marbell, P.1
Marculescu, D.2
-
25
-
-
13944266629
-
A case study in NOC design for embedded video
-
J. Xu, W. Wolf, J. Henkel, S. Chakradhar, T. Lv, "A case study in NOC design for embedded video," DATE 2004.
-
DATE 2004
-
-
Xu, J.1
Wolf, W.2
Henkel, J.3
Chakradhar, S.4
Lv, T.5
-
26
-
-
3042522902
-
High-level system modeling and architecture exploration with SystemC on a NOC SoC: S3C2510 case study
-
H. Jang, M. Kang, M. Lee, K. Chae, K. Lee, K. Shim, "High-level system modeling and architecture exploration with SystemC on a NOC SoC: S3C2510 case study," DATE 2004.
-
DATE 2004
-
-
Jang, H.1
Kang, M.2
Lee, M.3
Chae, K.4
Lee, K.5
Shim, K.6
-
27
-
-
0004026068
-
-
ARM Inc, May
-
"AMBA Specification," ARM Inc, May 1999.
-
(1999)
AMBA Specification
-
-
-
29
-
-
13944252448
-
The impact of technology scaling on processor lifetime reliability
-
December
-
Jayanth Srinivasan, Pradip Bose, Jude Rivers, "The impact of Technology Scaling on Processor Lifetime Reliability," UIUC CS Technical Report UIUCDCS-R-2003-2398, December 2003
-
(2003)
UIUC CS Technical Report
, vol.UIUCDCS-R-2003-2398
-
-
Srinivasan, J.1
Bose, P.2
Rivers, J.3
|