Signal-to-noise based local decorrelation compensation for speckle interferometry applications

Applied Optics

Volumn 47, Issue 19, 2008, Pages 3535-3542

  Molimard, Jérôme ^a   Cordero, Raul ^b,c   Vautrin, Alain ^a  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

^b DEPARTAMENTO DE FÍSICA   (Chile)

^c UNIVERSIDAD DE SANTIAGO DE CHILE   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; INTERFEROMETRY; OPTIMIZATION; SPECKLE;

DEFORMATION MEASUREMENTS; FIELD DEFORMATIONS; INTERACTIVE PROCESS; INTERFEROMETRIC TECHNIQUES; MECHANICAL DEFORMATION; SPECKLE CORRELATIONS; SPECKLE DECORRELATION; SPECKLE INTERFEROMETRY;

SIGNAL TO NOISE RATIO;

EID: 51949108000     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.003535     Document Type: Article

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