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Optics Communications

Volumn 241, Issue 4-6, 2004, Pages 279-292

Uncertainty evaluation of displacements measured by electronic speckle-pattern interferometry

(4) Cordero, Raúl R a,b Martínez, Amalia c Rodríguez Vera, Ramón c Roth, Pedro d

a ESCUELA SUPERIOR POLITÉCNICA DEL LITORAL (Ecuador)

b PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE (Chile)

c CENTRO DE INVESTIGACIONES EN ÓPTICA (Mexico)

d DEPARTAMENTO DE FÍSICA (Chile)

Author keywords

Displacement measurements; Speckle interferometry; Uncertainty analysis

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; INTERFEROMETRY; OPTICAL COLLIMATORS; PERTURBATION TECHNIQUES; PHASE SHIFT; SHEET METAL; SPECKLE; WAVEFRONTS;

COLLIMATION; DISPLACEMENT MEASUREMENTS; SPECKLE INTERFEROMETRY; UNCERTAINTY ANALYSIS;

UNCERTAIN SYSTEMS;

EID: 7544240942 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/j.optcom.2004.07.040 Document Type: Article

Times cited : (25)

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