Design of algorithms for phase measurements by the use of phase stepping

Applied Optics

Volumn 35, Issue 1, 1996, Pages 51-60

  Surrel, Yves ^a  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

Digital signal processing; Interferometry; Moir ; Waveform sampling

Indexed keywords

EID: 0002128002     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.000051     Document Type: Article

References (17)

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