-
1
-
-
84975606596
-
Accuracy of phase shifting interferometry
-
K. Kinnstatter, Q. W. Lohmann, J. Schwider, and N. Streibl, “Accuracy of phase shifting interferometry,” Appl. Opt. 27, 5082-5089 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 5082-5089
-
-
Kinnstatter, K.1
Lohmann, Q.W.2
Schwider, J.3
Streibl, N.4
-
2
-
-
0025808312
-
Interferometer accuracy and precision
-
D. R. Campbell, C. W. Johnson, and M. Lorenzen, eds., Proc. Soc. Photo-Opt. Instrum. Eng
-
L. A. Selberg, “Interferometer accuracy and precision,” in Optical Fabrication and Testing, D. R. Campbell, C. W. Johnson, and M. Lorenzen, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 1400, 24-32 (1990).
-
(1990)
Optical Fabrication and Testing
, vol.1400
, pp. 24-32
-
-
Selberg, L.A.1
-
3
-
-
84975597908
-
Linear approximation for measurement errors in phase shifting interferometry
-
J. van Wingerden, H. H. Frankena, and C. Smorenburg, “Linear approximation for measurement errors in phase shifting interferometry,” Appl. Opt. 30, 2718-2729 (1991).
-
(1991)
Appl. Opt
, vol.30
, pp. 2718-2729
-
-
Van Wingerden, J.1
Frankena, H.H.2
Smorenburg, C.3
-
4
-
-
0022948569
-
Comparison of phase-measurement algorithms
-
K. Creath, ed., Proc. Soc. Photo-Opt. Instrum. Eng
-
K. Creath, “Comparison of phase-measurement algorithms,” in Surface Characterization and Testing, K. Creath, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 680, 19-28 (1986).
-
(1986)
Surface Characterization and Testing
, vol.680
, pp. 19-28
-
-
Creath, K.1
-
5
-
-
0029250206
-
Vibration in phase shifting interferometry
-
“Errata,” 12, 2212 (1995)
-
P. de Groot, “Vibration in phase shifting interferometry,” J. Opt. Soc. Am. A12, 354-365 (1995); “Errata,” 12, 2212 (1995).
-
(1995)
J. Opt. Soc. Am.
, vol.A12
, pp. 354-365
-
-
De Groot, P.1
-
6
-
-
85010176150
-
Phase shifting interfer-ometry
-
D. Malacara, ed. (Wiley, New York, Chap. 14
-
J. E. Greivenkamp and J. H. Bruning, “Phase shifting interfer-ometry,” in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1992), Chap. 14.
-
(1992)
Optical Shop Testing
-
-
Greivenkamp, J.E.1
Bruning, J.H.2
-
7
-
-
0021412722
-
An optical profilometer for surface characterization of magnetic media
-
J. C. Wyant, C. L. Koliopoulos, B. Bushan, and O. E. George, “An optical profilometer for surface characterization of magnetic media,” ASLE Trans. 27, 101-105 (1984).
-
(1984)
ASLE Trans
, vol.27
, pp. 101-105
-
-
Wyant, J.C.1
Koliopoulos, C.L.2
Bushan, B.3
George, O.E.4
-
8
-
-
84975625453
-
Phase shifting interferometry: Reference phase error reduction
-
J. Schwider, “Phase shifting interferometry: reference phase error reduction,” Appl. Opt. 28, 3889-3892 (1989).
-
(1989)
Appl. Opt
, vol.28
, pp. 3889-3892
-
-
Schwider, J.1
-
9
-
-
5544251805
-
Some new error-compensating algorithms for phase-shifting interferometry
-
of 1994 OSA Technical Digest Series (Optical Society of America, Washington, D.C, postdeadline paper PD-4
-
J. Schmit and K. Creath, “Some new error-compensating algorithms for phase-shifting interferometry,” in Optical Fabrication and Testing, Vol. 13 of 1994 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1994), postdeadline paper PD-4.
-
(1994)
Optical Fabrication and Testing
, vol.13
-
-
Schmit, J.1
Creath, K.2
-
10
-
-
0028745825
-
Long-wavelength laser diode interferometer for surface flatness measurement
-
C. Gorecki, and R. W. Preater, eds., Proc. Soc. Photo-Opt. Instrum. Eng
-
P. de Groot, “Long-wavelength laser diode interferometer for surface flatness measurement,” in Optical Measurements and Sensors for the Process Industries, C. Gorecki, and R. W. Preater, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 2248, 136-140 (1994).
-
(1994)
Optical Measurements and Sensors for the Process Industries
, vol.2248
, pp. 136-140
-
-
De Groot, P.1
|