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Volumn 36, Issue 1, 2001, Pages 101-117

Moire interferometry for engineering mechanics: current practices and future developments

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; DIFFRACTION GRATINGS; MECHANICS; MICROELECTRONICS; MOIRE FRINGES;

EID: 0035083027     PISSN: 03093247     EISSN: None     Source Type: Journal    
DOI: 10.1243/0309324011512568     Document Type: Article
Times cited : (84)

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