Uncertainty analysis of displacements measured by phase-shifting Moiré interferometry

Optics Communications

Volumn 237, Issue 1-3, 2004, Pages 25-36

  Cordero, Raúl R ^a   Lira, Ignacio ^a  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

Author keywords

Moir interferometry; Phase shifting; Tensile tests; Uncertainty analysis

Indexed keywords

DIFFRACTION GRATINGS; HELIUM NEON LASERS; LOW PASS FILTERS; PERTURBATION TECHNIQUES; PHASE SHIFT; SHEET METAL;

DISPLACEMENT MEASUREMENT; MOIRÉ INTERFEROMETRY; STANDARD DEVIATION; UNCERTAINTY ANALYSIS;

INTERFEROMETRY;

EID: 2942536226     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.03.079     Document Type: Article

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