Whole-field analysis of uniaxial tensile tests by Moiré interferometry

Optics and Lasers in Engineering

Volumn 43, Issue 9, 2005, Pages 919-936

  Cordero, Raúl R ^a,b,d   François, Manuel ^c   Lira, Ignacio ^a   Vial Edwards, Cristián ^a  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^b ESCUELA SUPERIOR POLITÉCNICA DEL LITORAL   (Ecuador)

^c UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^d NONE   (Chile)

Author keywords

Moir interferometry; Strain localization; Stress fields; Tensile tests

Indexed keywords

ALUMINUM; IMAGE PROCESSING; INTERFEROMETRY; PLASTIC DEFORMATION; POLYNOMIAL APPROXIMATION; REAL TIME SYSTEMS; STRAIN; TENSILE TESTING; TENSORS;

SHEAR BAND; STRAIN LOCALIZATION; STRESS FIELDS; TENSILE DEFORMATION;

MOIRE FRINGES;

EID: 20344388097     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2004.10.002     Document Type: Article

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