Out-of-plane displacement measurement by electronic speckle pattern interferometry in presence of large in-plane displacement

Optics Communications

Volumn 208, Issue 1-3, 2002, Pages 17-24

  Martinez Celorio R A ^a   Barrientos, B ^a   Sanchez Marín, Francisco J ^a   López, Luis Martí ^b   Rayas, J A ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b CENTRO DE NEUROCIENCIAS DE CUBA   (Cuba)

Author keywords

Digital speckle photography; ESPI; Spatial phase stepping

Indexed keywords

DEFORMATION; IMAGE ANALYSIS; INTERFEROMETRY; PHOTOGRAPHY;

DIGITAL SPECKLE PHOTOGRAPHY (DSP);

SPECKLE;

EID: 0036666218     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(02)01556-0     Document Type: Article

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