Deterministic software-based self-testing of embedded processor cores

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 92-96

  Paschalis, A ^a   Gizopoulos, D ^b   Kranitis, N ^c   Psarakis, M ^c   Zorian, Y ^d  

^a UNIVERSITY OF ATHENS   (Greece)

^b UNIVERSITY OF PIRAEUS   (Greece)

^c INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

^d LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMBEDDED PROCESSORS; FUNCTIONAL MODULES; OUTPUT ANALYSIS; PERFORMANCE DEGRADATION; PROCESSOR DATAPATH; REPETITIVE FAULT; SOFTWARE BASED SELF TESTING; TEST GENERATIONS;

EXHIBITIONS;

EID: 51749096347     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915006     Document Type: Conference Paper

References (14)

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