Embedded hardware and software self-testing methodologies for processor cores

Proceedings-Design Automation Conference

Volumn , Issue , 2000, Pages 625-630

  Chen, Li ^a   Dey, Sujit ^a   Sanchez, Pablo ^b   Sekar, Krishna ^a   Chen, Ying ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CANTABRIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COMPUTER SOFTWARE; DATA STORAGE EQUIPMENT; EMBEDDED SYSTEMS;

EMBEDDED HARDWARE; PROCESSOR CORES;

BUILT-IN SELF TEST;

EID: 0033685464     PISSN: 0738100X     EISSN: None     Source Type: Journal    
DOI: 10.1109/DAC.2000.855388     Document Type: Article

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