Critical path selection for delay test considering coupling noise

Proceedings - 13th IEEE European Test Symposium, ETS 2008

Volumn , Issue , 2008, Pages 119-124

  Tayade, Rajeshwary ^a   Abraham, Jacob A ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLING NOISE; CRITICAL PATHS;

CONSTRAINT THEORY; INTEGRATED CIRCUIT TESTING; NETWORKS (CIRCUITS); TIMING CIRCUITS;

CONSTRAINED OPTIMIZATION;

EID: 51549105936     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETS.2008.28     Document Type: Conference Paper

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