Longest path selection for delay test under process variation

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2004, Pages 98-103

  Lu, Xiang ^a   Li, Zhuo ^a   Qiu, Wangqi ^a   Walker, D M H ^a   Shi, Weiping ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FUNCTIONS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OPTIMIZATION; PROCESS CONTROL;

DELAY OPTIMIZATION TOOLS; FAULT SITES; PATH DELAY; PROCESS VARIATION;

DELAY CIRCUITS;

EID: 2442557252     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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