A sensitivity based approach to analyzing signal delay uncertainty of coupled interconnects

Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004

Volumn , Issue , 2004, Pages 331-336

  Kulkarni, Medha ^a   Chen, Tom ^a  

^a Department of Mechanical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; STATISTICAL METHODS; VLSI CIRCUITS;

DELAY STATISTICS; MILLER COUPLING FACTOR (MCF); SIGNAL DELAY; VICTIM LINE DELAY;

SIGNAL PROCESSING;

EID: 2942692027     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2004.1283696     Document Type: Conference Paper

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