Dynamic compaction for high quality delay test

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2008, Pages 243-248

  Wang, Zheng ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Delay test; Dynamic compaction; Path delay fault; Test generation

Indexed keywords

DELAY TEST; DYNAMIC COMPACTION; PATH DELAY FAULT; TEST GENERATION;

BENCHMARKING; BOOLEAN FUNCTIONS; COMPACTION; LOGIC CIRCUITS; POWDERS; SEQUENTIAL SWITCHING;

TESTING;

EID: 51449105901     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2008.54     Document Type: Conference Paper

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