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Volumn , Issue , 2008, Pages 611-622

Thermomechanical reliability study of flip-chip solder bumps: Using laser ultrasound technique and finite element method

Author keywords

[No Author keywords available]

Indexed keywords

SOLDER BUMPING;

EID: 51349113088     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550036     Document Type: Conference Paper
Times cited : (10)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.