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Volumn 124, Issue 3, 2002, Pages 221-226

Vibration analysis based modeling and defect recognition for flip-chip solder-joint inspection

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0041870450     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1464878     Document Type: Article
Times cited : (34)

References (14)
  • 2
    • 0026106013 scopus 로고
    • X-ray systems keep pace with SMT
    • Feb
    • Edward, S., 1991, "X-Ray Systems Keep Pace with SMT," Test Meas. World, Feb.
    • (1991) Test Meas. World
    • Edward, S.1
  • 3
    • 0029390149 scopus 로고
    • Acoustic micro imaging of flip chip interconnects
    • Oct.
    • Adams, Tom, 1995, "Acoustic micro imaging of flip chip interconnects," III-Vs Review, 8, No. 5, Oct., pp. 50-52.
    • (1995) III-Vs Review , vol.8 , Issue.5 , pp. 50-52
    • Adams, T.1
  • 4
    • 0031378960 scopus 로고    scopus 로고
    • Further investigation into the use of acoustic micro imaging for analyzing flip chip integrity and failure modes
    • Semmens, Janet E., and Kessler, Lawrence W., 1997, "Further investigation into the use of acoustic micro imaging for analyzing flip chip integrity and failure modes," Proceedings of SPIE, pp. 165-169.
    • (1997) Proceedings of SPIE , pp. 165-169
    • Semmens, J.E.1    Kessler, L.W.2
  • 5
    • 0026623834 scopus 로고
    • Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique
    • Jan.
    • Kubota, J., Musha, Y., and Takahashi, M., 1992, "Imaging flaws in soldered joints of integrated circuits using an ultrasound electronic scanning technique," IEEE Trans. Ultrason. Ferroelectr. Freq. Control, 39(1), Jan., pp. 122-126.
    • (1992) IEEE Trans. Ultrason. Ferroelectr. Freq. Control , vol.39 , Issue.1 , pp. 122-126
    • Kubota, J.1    Musha, Y.2    Takahashi, M.3
  • 6
    • 0032083690 scopus 로고    scopus 로고
    • Parallel test method for MCM substrate interconnection networks
    • Newman, K. E. et al., 1998, "Parallel Test Method for MCM Substrate Interconnection Networks," Int. J. Microcircuits Electron. Packag., 21(2).
    • (1998) Int. J. Microcircuits Electron. Packag. , vol.21 , Issue.2
    • Newman, K.E.1
  • 7
    • 0024864265 scopus 로고
    • Laser induced infrared signature: The stepping stone to statistical process control for PTH, SMT, FPT and TAB
    • CA
    • Vanzetti, Ricardo, and Traub, Alan C., 1989, "Laser induced infrared signature: the stepping stone to statistical process control for PTH, SMT, FPT and TAB," International SAMPE Symposium and Exhibition, CA, pp. 130-140.
    • (1989) International SAMPE Symposium and Exhibition , pp. 130-140
    • Vanzetti, R.1    Traub, A.C.2
  • 12
    • 85199280143 scopus 로고    scopus 로고
    • A novel method and device for solder joint quality inspection by using laser ultrasound
    • Las Vegas, May
    • Liu, Erdahl, Ume and Achari, 2000, "A Novel Method and Device for Solder Joint Quality Inspection by using Laser Ultrasound," IEEE ECTC 2000 Conference, Las Vegas, May.
    • (2000) IEEE ECTC 2000 Conference
    • Liu, E.1    Ume2    Achari3
  • 14
    • 0032189833 scopus 로고    scopus 로고
    • Experimental and numerical results for intensity modulated laser ultrasonic
    • Oct
    • Sanderson, T., Ume, C., and Jarzynski, J., 1998, "Experimental and Numerical Results for Intensity Modulated Laser Ultrasonic," J. Acoust. Soc. Am., 104(4), Oct, pp. 2207-2212.
    • (1998) J. Acoust. Soc. Am. , vol.104 , Issue.4 , pp. 2207-2212
    • Sanderson, T.1    Ume, C.2    Jarzynski, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.