Characterization of scaled MANOS nonvolatile semiconductor memory (NVSM) devices

Solid-State Electronics

Volumn 52, Issue 10, 2008, Pages 1491-1497

  Wang, Gan ^a   White, Marvin H ^a  

^a Lehigh University   (United States)

Author keywords

Characterization; MANOS; Nonvolatile semiconductor memory (NVSM); Quantum mechanical tunneling; SONOS; Write erase

Indexed keywords

METALS; SEMICONDUCTOR STORAGE;

CHARACTERIZATION; MANOS; NONVOLATILE SEMICONDUCTOR MEMORY; NONVOLATILE SEMICONDUCTOR MEMORY (NVSM); QUANTUM-MECHANICAL TUNNELING; SONOS; WRITE/ERASE;

SEMICONDUCTOR DEVICES;

EID: 50849124092     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2008.06.036     Document Type: Article

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