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1
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33748473516
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http://www.itrs.net/Common/2004Update/2004_03_PIDS.pdf This website provides and updated International Roadmap for Semiconductors (ITRS) Tables 50(a) and 50(b) describe projections for Nonvolatile Semiconductor Memory Devices and Circuits.
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2
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0342291279
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Nonvolatile semiconductor memory technology
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IEEE Press, Ed. W. D. Brown and J. E. Brewer, Chpt. 5, F. R. Libsch and M. H. White
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Nonvolatile Semiconductor Memory Technology. IEEE Press, Ed. W. D. Brown and J. E. Brewer, Chpt. 5, SONOS Nonvolatile Semiconductor Memories, F. R. Libsch and M. H. White, 309-357: 1998.
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(1998)
SONOS Nonvolatile Semiconductor Memories
, pp. 309-357
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3
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0034224349
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On the Go with SONOS
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M. H. White, D. A. Adams and J. Bu, On the Go with SONOS, IEEE Circuits Dev., 16, 22 (2000).
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(2000)
IEEE Circuits Dev.
, vol.16
, pp. 22
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White, M.H.1
Adams, D.A.2
Bu, J.3
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4
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0035367442
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MNOS nonvolatile semiconductor memory technology: Present and future
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Y. Kamagaki amd S. Minami, MNOS Nonvolatile Semiconductor Memory Technology: Present and Future, IEICE Trans. Electron, E84-C, No. 6, 713-723 (2001).
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(2001)
IEICE Trans. Electron
, vol.E84-C
, Issue.6
, pp. 713-723
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Kamagaki, Y.1
Minami, S.2
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5
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0022757159
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MOSFET drain breakdown voltage
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W. S. Feng, T. Y. Chan, and C. Hu, MOSFET drain breakdown voltage, IEEE Electron Device Lett., 6, 449 (1986)
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(1986)
IEEE Electron Device Lett.
, vol.6
, pp. 449
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Feng, W.S.1
Chan, T.Y.2
Hu, C.3
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6
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0035506164
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Characterization of channel hot electron injection by the subthreshold slope of NROM™ device
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E. Lusky, Y. Shacham-Diamand, I. Bloom, and B. Eitan, Characterization of Channel Hot Electron Injection by the Subthreshold Slope of NROM™ Device, IEEE Elec. Dev. Lett., 22, 556-558 (2001)
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(2001)
IEEE Elec. Dev. Lett.
, vol.22
, pp. 556-558
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Lusky, E.1
Shacham-Diamand, Y.2
Bloom, I.3
Eitan, B.4
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7
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0035148013
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Design considerations in scaled SONOS NVSM
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J. Bu and M. H. White, Design Considerations in Scaled SONOS NVSM, Solid-State Electronics, 45, 113-120 (2001).
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(2001)
Solid-state Electronics
, vol.45
, pp. 113-120
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Bu, J.1
White, M.H.2
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8
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0023310984
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Characterization of charge transport and trapping in scaled SONOS/MONOS memory devices
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C. C. Chao and M. H. White, Characterization of Charge Transport and Trapping in Scaled SONOS/MONOS memory Devices, Solid-State Electronics, 30, 307 (1987).
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(1987)
Solid-state Electronics
, vol.30
, pp. 307
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Chao, C.C.1
White, M.H.2
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9
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0024985779
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Charge transport and storage of low programming voltage SONOS/MONOS memory devices
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F. R. Libsch and M. H. White, Charge transport and storage of low programming voltage SONOS/MONOS memory devices, Solid-Sate Electronics, 33, 105-126 (1990)
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(1990)
Solid-sate Electronics
, vol.33
, pp. 105-126
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Libsch, F.R.1
White, M.H.2
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10
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0025449438
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A new approach to study electron and hole separation at the semiconductor-insulator interface
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A. Roy and M. H. White, A New Approach to Study Electron and Hole Separation at the Semiconductor-Insulator Interface, IEEE Trans. Elect. Dev., 37, 1504 (1990)
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(1990)
IEEE Trans. Elect. Dev.
, vol.37
, pp. 1504
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Roy, A.1
White, M.H.2
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11
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0024768422
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Electron and hole charge separation with a dual channel transistor
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November
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and Anirban Roy and Marvin H. White, "Electron and Hole Charge Separation with a Dual Channel Transistor", IEEE Transactions on Electron Devices, 36, 11, November 1989.
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(1989)
IEEE Transactions on Electron Devices
, vol.36
, pp. 11
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Roy, A.1
White, M.H.2
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12
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0026963425
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Observation of near-interface oxide traps with the charge pumping technique
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R. E. Paulsen, M. L. French and M. H. White, Observation of near-interface oxide traps with the charge pumping technique, IEEE Electron Dev. Lett., 13, 627 (1992)
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(1992)
IEEE Electron Dev. Lett.
, vol.13
, pp. 627
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Paulsen, R.E.1
French, M.L.2
White, M.H.3
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14
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0029321576
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Respective contributions of the fast and slow traps to charge pumping measurements
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Elsevier
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D. Bauza and G. Ghibaudo, Respective contributions of the fast and slow traps to charge pumping measurements, Microelectronics Engineering (Elsevier), 28, 325 (1995)
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(1995)
Microelectronics Engineering
, vol.28
, pp. 325
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Bauza, D.1
Ghibaudo, G.2
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15
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0035148396
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Electrical characterization of the ONO triple dielectric in SONOS nonvolatile memory devices
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J. Bu and M. H. White, Electrical Characterization of the ONO Triple dielectric in SONOS nonvolatile memory devices, Solid-State Electronics, 45, 47 (2001).
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(2001)
Solid-state Electronics
, vol.45
, pp. 47
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Bu, J.1
White, M.H.2
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16
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0023399719
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An improved method of MOSFET modeling and parameter extraction
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August
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T. J. Krutsick, M. H. White, H-S Wong and R. V. Booth, An Improved Method of MOSFET Modeling and Parameter Extraction, IEEE Trans. on Electron Devices, 34. August 1987.
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(1987)
IEEE Trans. on Electron Devices
, vol.34
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Krutsick, T.J.1
White, M.H.2
Wong, H.-S.3
Booth, R.V.4
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17
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0023422261
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Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFET's
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August
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H-S Wong, M. H. White; T. J. Krutsick, and R. V. Booth, Modeling of Transconductance Degradation and Extraction of Threshold Voltage in Thin Oxide MOSFET's, Solid-State Electronics, 30, August 1987.
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(1987)
Solid-state Electronics
, vol.30
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Wong, H.-S.1
White, M.H.2
Krutsick, T.J.3
Booth, R.V.4
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18
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18844394450
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Scaled SONOS NVSM devices for space and military applications
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Pasadena, CA November 11-13
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Marvin H. White, Yijie (Sandy) Zhao, Yu (Richard) Wang, Stephen J. Wrazien, Joel D. Krayer, Dennis A. Adams and James R. Murray, Scaled SONOS NVSM Devices for Space and Military Applications, NASA/JPL Non-Volatile Memory Technology Symposium (NVMTS), Pasadena, CA November 11-13, 2003
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(2003)
NASA/JPL Non-volatile Memory Technology Symposium (NVMTS)
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White, M.H.1
Zhao, Y.2
Wang, Y.3
Wrazien, S.J.4
Krayer, J.D.5
Adams, D.A.6
Murray, J.R.7
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19
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0027675648
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Charge retention in scaled SONOS nonvolatile semiconductor memory devices - Modeling and characterization
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Y Hu and M. H. White, Charge retention in scaled SONOS nonvolatile semiconductor memory devices - modeling and characterization, Solid-State Electronics, 36, 1401 (1993).
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(1993)
Solid-state Electronics
, vol.36
, pp. 1401
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Hu, Y.1
White, M.H.2
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20
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0033728046
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Charge retention of scaled SONOS nonvolatile memory devices at elevated temperature
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Y. Yang and M. H. White, Charge retention of scaled SONOS nonvolatile memory devices at elevated temperature, Solid-State Electronics, 44, 949-58 (2000)
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(2000)
Solid-state Electronics
, vol.44
, pp. 949-958
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Yang, Y.1
White, M.H.2
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21
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9544237154
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An analytical retention model for SONOS nonvolatile memory devices in the excess electron state
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Yu Wang and Marvin H. White, An analytical retention model for SONOS nonvolatile memory devices in the excess electron state, Solid-State Electronics, 49, 97 (2005).
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(2005)
Solid-state Electronics
, vol.49
, pp. 97
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Wang, Y.1
White, M.H.2
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22
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0001439114
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Scaling of multidielectric nonvolatile SONOS memory structures
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M. L. French and M. H. White, Scaling of multidielectric nonvolatile SONOS Memory Structures, Solid-State Electronics, 37, 1913 (1994).
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(1994)
Solid-state Electronics
, vol.37
, pp. 1913
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French, M.L.1
White, M.H.2
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23
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0035128205
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Effects of two-step high temperature deuterium anneals on SONOS nonvolatile memory devices
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J. Bu and M. H. White, Effects of two-step high temperature deuterium anneals on SONOS nonvolatile memory devices, IEEE Electron Dev. Lett., 22, 17 (2001)
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(2001)
IEEE Electron Dev. Lett.
, vol.22
, pp. 17
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Bu, J.1
White, M.H.2
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24
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3142683272
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A novel SONOS nonvolatile flash memory device using substrate hot-hole injection for write and gate tunneling for erase
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Y, Wang, Y. Zhao, B. M. Khan, C. L. Doherty, J. D. Krayer and M. H. White, A novel SONOS nonvolatile flash memory device using substrate hot-hole injection for write and gate tunneling for erase, Solid-State Electronics, 48, 2031 (2004).
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(2004)
Solid-state Electronics
, vol.48
, pp. 2031
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Wang, Y.1
Zhao, Y.2
Khan, B.M.3
Doherty, C.L.4
Krayer, J.D.5
White, M.H.6
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25
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18844377654
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Characterization of scaled SONOS EEPROM memory devices for space and military systems
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Orlando, Fla November
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Marvin H. White, Dennis A. Adams, James R. Murray, Stephen Wrazien, Yijie (Sandy) Zhao, Yu (Richard) Wang, Bilal Khan, Wayne Miller and Rajiv Mehrotra, Characterization of Scaled SONOS EEPROM Memory Devices for Space and Military Systems, NASA/JPL Non Volatile Memory Technology Symposium (NFMTS), Orlando, Fla November 2004.
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(2004)
NASA/JPL Non Volatile Memory Technology Symposium (NFMTS)
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White, M.H.1
Adams, D.A.2
Murray, J.R.3
Wrazien, S.4
Zhao, Y.5
Wang, Y.6
Khan, B.7
Miller, W.8
Mehrotra, R.9
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