High-k materials for nonvolatile memory applications

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 234-239

  Van Houdt, Jan ^a  

^a IMEC   (Belgium)

Author keywords

Engineered barrier; Flash memory; High k materials; Nonvolatile memory

Indexed keywords

ENGINEERED BARRIERS; HIGH-K MATERIALS; INTERPOLY DIELECTRICS (IPD); NONVOLATILE MEMORY;

DIELECTRIC MATERIALS; ELECTRIC CHARGE; FLASH MEMORY; RELIABILITY;

NONVOLATILE STORAGE;

EID: 28744456880     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)

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