Statistical analysis of RF circuits using combined circuit simulator-full wave field solver approach

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2007, Pages 11-17

  Sathanur, Arun V ^a   Chakraborty, Ritochit ^a   Jandhyala, Vikram ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT PERFORMANCES; CIRCUIT SIMULATORS; COMPUTER-AIDED DESIGN; DISTRIBUTED STRUCTURES; EQUIVALENT CIRCUIT PARAMETERS; EQUIVALENT PARAMETERS; FULL WAVES; GAUSSIAN RANDOM VARIABLES; HIERARCHICAL APPROACH; INTERCONNECT STRUCTURES; INTERNATIONAL CONFERENCES; MONTE CARLO; NON-GAUSSIAN; OBJECTIVE FUNCTIONS; PASSIVE COMPONENTS; PERFORMANCE MEASURES; PROBABILITY DENSITY FUNCTIONS; PROCESS PARAMETERS; PROCESS VARIATIONS; RAPID RESPONSE; RESPONSE SURFACES; RF CIRCUITS; STATISTICAL ANALYSIS; Y-PARAMETERS;

CIRCUIT SIMULATION; CLUSTER ANALYSIS; COUPLED CIRCUITS; DESIGN; ELECTRIC NETWORK PARAMETERS; ELECTRICAL ENGINEERING; ELECTROMAGNETISM; FIELD EFFECT TRANSISTORS; GAUSSIAN NOISE (ELECTRONIC); MOSFET DEVICES; NETWORKS (CIRCUITS); PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES; RANDOM VARIABLES; RISK ASSESSMENT; STATISTICAL METHODS; SURFACE PROPERTIES; TRELLIS CODES;

ELECTRIC NETWORK ANALYSIS;

EID: 50249154936     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2007.4397237     Document Type: Conference Paper

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