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Volumn 13, Issue 4, 2000, Pages 401-407

Analysis of the impact of process variations on clock skew

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRIC NETWORK PARAMETERS; MONTE CARLO METHODS; MOSFET DEVICES; SPURIOUS SIGNAL NOISE; TIMING CIRCUITS; VLSI CIRCUITS;

EID: 0034313367     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.892625     Document Type: Article
Times cited : (47)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.