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Volumn , Issue , 2008, Pages 172-175

Influence of the substrate on the lifetime of capacitive RF MEMS switches

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; ELECTRIC SWITCHES; MECHANICAL ENGINEERING; MECHANICS; MECHATRONICS; MEMS; MICROELECTROMECHANICAL DEVICES; OPTICAL DESIGN; REACTIVE ION ETCHING; SWITCHES; TIME SWITCHES;

EID: 50149108184     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2008.4443620     Document Type: Conference Paper
Times cited : (23)

References (13)
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    • Measurements of charging in capacitive microelectromechanical switches
    • November
    • J. R. Reid and R.T. Webster, "Measurements of charging in capacitive microelectromechanical switches", Electronics letters, vol. 38, No. 24, November 2002.
    • (2002) Electronics letters , vol.38 , Issue.24
    • Reid, J.R.1    Webster, R.T.2
  • 5
    • 0032208481 scopus 로고    scopus 로고
    • Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)
    • J. Wibbeler, G. Pfeifer, M. Hietschold, "Parasitic charging of dielectric surfaces in capacitive microelectromechanical systems (MEMS)", Sensors and Actuators A, 71, pp. 74-80, 1998.
    • (1998) Sensors and Actuators A , vol.71 , pp. 74-80
    • Wibbeler, J.1    Pfeifer, G.2    Hietschold, M.3
  • 6
    • 34948822844 scopus 로고    scopus 로고
    • Analytical model of the DC actuation of electrostatic MEMS devices with distributed dielectric charging and nonplanar electrodes
    • October
    • X. Rottenberg, I. De Wolf, B.K.J.C Nauwelaers, W. De Raedt and H.A.C. Tilmans, "Analytical model of the DC actuation of electrostatic MEMS devices with distributed dielectric charging and nonplanar electrodes", JMEMS, vol. 16(5), pp. 1243-1253, October 2007.
    • (2007) JMEMS , vol.16 , Issue.5 , pp. 1243-1253
    • Rottenberg, X.1    De Wolf, I.2    Nauwelaers, B.K.J.C.3    De Raedt, W.4    Tilmans, H.A.C.5
  • 8
    • 33847152993 scopus 로고    scopus 로고
    • Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
    • Workshop, pp
    • P. Czarnecki, X. Rottenberg, R. Puers and I. De Wolf, "Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches", in Proc. MEMSWAVE 2005 Workshop, pp. 133-136.
    • (2005) Proc. MEMSWAVE , pp. 133-136
    • Czarnecki, P.1    Rottenberg, X.2    Puers, R.3    De Wolf, I.4
  • 9
    • 28744450605 scopus 로고    scopus 로고
    • The influence of the package environment on the functioning and reliability of RF-MEMS switches
    • USA
    • W.M. van Spengen, P. Czarnecki, R. Puers, J.T.M. van Beek, I. De Wolf "The influence of the package environment on the functioning and reliability of RF-MEMS switches", in Proc. IEEE 43rd IRPS 2005, pp. 337-341, USA.
    • Proc. IEEE 43rd , vol.IRPS 2005 , pp. 337-341
    • van Spengen, W.M.1    Czarnecki, P.2    Puers, R.3    van Beek, J.T.M.4    De Wolf, I.5
  • 10
    • 33750143099 scopus 로고    scopus 로고
    • Effect of gas pressure on the lifetime of capacitive RF MEMS switches, in Proc
    • P. Czarnecki, X. Rottenberg, R. Puers and I. De Wolf, "Effect of gas pressure on the lifetime of capacitive RF MEMS switches", in Proc. IEEE MEMS 2006, pp.890-893.
    • (2006) IEEE MEMS , pp. 890-893
    • Czarnecki, P.1    Rottenberg, X.2    Puers, R.3    De Wolf, I.4
  • 13
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    • www.ansoft.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.