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High Temperature Aging Affects on Lead Free CSPs - Drop Test Reliability
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Effect of Imtermetallic and Kirkendall Voids Growth on Board Level Drop Reliability for SnAgCu Lead-free BGA Solder Joint
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San Diego, CA, June
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Insights into Correlation Between Board-level Drop Reliability and Package-level Ball Impact Test
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Investigation of IMC Thickness Effect on the Lead-free Solder Ball Attachment Strength-Comparison between Ball Shear Test and Cold Bump Pull Test Results
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San Diego, CA, June
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F. B. Song and S. W. R. Lee, "Investigation of IMC Thickness Effect on the Lead-free Solder Ball Attachment Strength-Comparison between Ball Shear Test and Cold Bump Pull Test Results," Proc. 56th Electronic Components & Technology Conference, San Diego, CA, June 2006, pp. 1196-1203.
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Reno, NV, June
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F. B. Song, S. W. R. Lee, K. Newman, B. Sykes and S. Clark, "High Speed Solder Ball Shear and Pull Tests vs. Board Level Mechanical Drop Tests: Correlation of Failure Mode and Loading Speed," Proc. 57th Electronic Components & Technology Conference, Reno, NV, June 2007, pp. 1504-1513.
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Characterization of Failure Modes and Analysis of Joint Strength Using Various Conditions for High Speed Solder Ball Shear and Cold Ball Pull Tests
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Oulu, Finland, June 17-20
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F. B. Song, S. W. R. Lee, S. Clark, B. Sykes and K. Newman, "Characterization of Failure Modes and Analysis of Joint Strength Using Various Conditions for High Speed Solder Ball Shear and Cold Ball Pull Tests," Proc. 16th EMPC, Oulu, Finland, June 17-20, 2007, pp. 413-418.
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16
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35348832874
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Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Test
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Reno, NV, June
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F. B. Song, S. W. R. Lee, K. Newman, B. Sykes and S. Clark, "Brittle Failure Mechanism of SnAgCu and SnPb Solder Balls during High Speed Ball Shear and Cold Ball Pull Test," Proc. 57th Electronic Components & Technology Conference, Reno, NV, June 2007. pp. 364-372.
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F. B. Song, S. W. R. Lee, K. Newman, B. Sykes and S. Clark, "Effect of Thermal Aging on High Speed Ball Shear and Pull Tests of SnAgCu Lead-free Solder Balls," Proc. 9th Electronic Packaging Technology Conference, Singapore, December 2007.
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18
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50049119016
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JEDEC Standard JESD22-B110A, Subassembly Mechanical Shock, November 2004.
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JEDEC Standard JESD22-B110A, "Subassembly Mechanical Shock," November 2004.
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