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Volumn 2006, Issue , 2006, Pages

High speed pull test characterization of BGA solder joints

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DYNAMIC LOADS; ELECTRONIC EQUIPMENT; FRACTURE; PORTABLE EQUIPMENT; RELIABILITY;

EID: 33847164127     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2006.1644005     Document Type: Conference Paper
Times cited : (22)

References (9)
  • 1
    • 2942740958 scopus 로고    scopus 로고
    • Impact life prediction modeling of TFBGA packages under board level drop test
    • Tee, T.Y., Ng, H.S., Lim, C.T., Pek, E., Zhong, Z., "Impact life prediction modeling of TFBGA packages under board level drop test", Microelectronics Reliability, Vol. 44 (2004), pp. 1131-1142.
    • (2004) Microelectronics Reliability , vol.44 , pp. 1131-1142
    • Tee, T.Y.1    Ng, H.S.2    Lim, C.T.3    Pek, E.4    Zhong, Z.5
  • 2
    • 30844472660 scopus 로고    scopus 로고
    • Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition
    • Yi-Shao, L., Ping-Feng, Y., Chang-Lin, Y., "Experimental studies of board-level reliability of chip-scale packages subjected to JEDEC drop test condition" Microelectronics Reliability, Vol. 46 (2006), pp. 645-650.
    • (2006) Microelectronics Reliability , vol.46 , pp. 645-650
    • Yi-Shao, L.1    Ping-Feng, Y.2    Chang-Lin, Y.3
  • 3
    • 3142756580 scopus 로고    scopus 로고
    • Ductile-to-brittle transition in Sn-Zn solder joints measured by impact test
    • Date, M., Shoji, T., Fujiyoshi, M., Sato, K., and Tu, K. N., "Ductile-to-brittle transition in Sn-Zn solder joints measured by impact test," Scripta Materialia, Vol. 51(2004), pp. 641-647.
    • (2004) Scripta Materialia , vol.51 , pp. 641-647
    • Date, M.1    Shoji, T.2    Fujiyoshi, M.3    Sato, K.4    Tu, K.N.5
  • 4
    • 28844508319 scopus 로고    scopus 로고
    • Shengquan, O., Yuhuan, X., and Tu, K. N., Alam, M.O., and Chan, Y.C., A Study of Impact Reliability of Lead-free EGA Balls on Au/Electrolytic Ni/Cu Bond Pad, Mater. Res. Soc. Symp., Proc. 863, MRS 2005, Paper B 10.5.1-6.
    • Shengquan, O., Yuhuan, X., and Tu, K. N., Alam, M.O., and Chan, Y.C., "A Study of Impact Reliability of Lead-free EGA Balls on Au/Electrolytic Ni/Cu Bond Pad", Mater. Res. Soc. Symp., Proc. Vol. 863, MRS 2005, Paper B 10.5.1-6.
  • 8
    • 33847144521 scopus 로고    scopus 로고
    • JEDEC Solid State Technology Association, JESD22-B111: Board level drop test method of component for handheld electronics products, 2003.
    • JEDEC Solid State Technology Association, JESD22-B111: "Board level drop test method of component for handheld electronics products", 2003.
  • 9
    • 19944432174 scopus 로고    scopus 로고
    • Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability
    • 1-8
    • Zeng, K., Stierman R., Chiu, T.C., and Edwards, D., Ano, K., Tu, K.N., "Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability", J. Appl, Phys., Vol. 97 (2005), pp. 24508/1-8.
    • (2005) J. Appl, Phys , vol.97 , pp. 24508
    • Zeng, K.1    Stierman, R.2    Chiu, T.C.3    Edwards, D.4    Ano, K.5    Tu, K.N.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.