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Volumn 108, Issue 10, 2008, Pages 1196-1199

Characterization of the tip-loading force-dependent tunneling behavior in alkanethiol metal-molecule-metal junctions by conducting atomic force microscopy

Author keywords

Conducting atomic force microscopy; Molecular electronics; Self assembled monolayers; Tunneling

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON ENERGY LEVELS; EXCAVATION; IMAGING TECHNIQUES; LITHOGRAPHY; METALS; MICROSCOPIC EXAMINATION; MOLECULES; SCANNING PROBE MICROSCOPY; TUNNELING (EXCAVATION);

EID: 49949084046     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.016     Document Type: Article
Times cited : (11)

References (29)
  • 1
    • 0141641976 scopus 로고    scopus 로고
    • Reed M.A., and Lee T. (Eds), American Scientific Publishers, Stevenson Ranch, CA
    • In: Reed M.A., and Lee T. (Eds). Molecular Nanoelectronics (2003), American Scientific Publishers, Stevenson Ranch, CA
    • (2003) Molecular Nanoelectronics
  • 2
    • 20144382034 scopus 로고    scopus 로고
    • Cuniberti G., Fagas G., and Richter K. (Eds), Springer, Berlin (Heidelberg/New York)
    • In: Cuniberti G., Fagas G., and Richter K. (Eds). Introducing Molecular Electronics (2005), Springer, Berlin (Heidelberg/New York)
    • (2005) Introducing Molecular Electronics


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.