Electron transfer through organic monolayers directly bonded to silicon probed by current sensing atomic force microscopy: Effect of chain length and applied force

Journal of Physical Chemistry B

Volumn 108, Issue 44, 2004, Pages 17129-17135

  Zhao, Jianwei ^a,b   Uosaki, Kohei ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATTENUATION; ELECTRIC POTENTIAL; ELECTRON TUNNELING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLATINUM; SEMICONDUCTOR MATERIALS; SILICON;

METAL JUNCTIONS; MOLECULAR MATERIALS; RADICAL INITIATORS; SUN FREQUENCY GENERATION (SFG);

MONOLAYERS;

EID: 9144239925     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp049719+     Document Type: Article

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