메뉴 건너뛰기




Volumn 109, Issue 16, 2005, Pages 7597-7600

XPS characterization of Au (core)/SiO2 (shell) nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; KINETIC ENERGY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SILICA; STRUCTURE (COMPOSITION); VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 18444379663     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp050767j     Document Type: Article
Times cited : (103)

References (39)
  • 38
    • 18444392562 scopus 로고    scopus 로고
    • note
    • Differential charging is frequently encountered in XPS analysis of poorly conducting samples and is considered a nuisance, but it can be turned into a useful analytical tool (Suzer, S. Anal. Chem. 2003, 75, 2939). For example, as we had demonstrated earlier, atoms within the same domain of a heterogeneous surface structure exhibit similar charging behavior as in the case of Au 4f and Si 2p peaks of the core-shell nanoparticles studied in this work.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.