Improving circuit robustness with cost-effective soft-error-tolerant sequential elements

Proceedings of the Asian Test Symposium

Volumn , Issue , 2007, Pages 307-312

  Chen, Mingjing ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMOLOGY; COST EFFECTIVENESS; ERROR CORRECTION; MICROPROCESSOR CHIPS; RADIATION HARDENING; RADIATION PROTECTION; TESTING;

ALPHA PARTICLES; CHALLENGING PROBLEM; CIRCUIT HARDENING; COMBINATORIAL LOGIC; DESIGN FLOWS; DESIGN TECHNIQUES; DIGITAL DESIGNS; ERROR-TOLERANT; HARDWARE COSTS; NANOSCALE CIRCUITS; SEQUENTIAL ELEMENTS; SIMULATION RESULTS; SOFT ERRORS; TRANSIENT FAULTS;

NETWORKS (CIRCUITS);

EID: 48049113957     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2007.4388030     Document Type: Conference Paper

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