Test generation for timing-critical transition faults

Proceedings of the Asian Test Symposium

Volumn , Issue , 2007, Pages 493-498

  Lin, Xijiang ^a   Kassab, Mark ^a   Rajski, Janusz ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY DEFECTS; DELAY TESTING; HIGH-QUALITY; INDUSTRIAL CIRCUITS; TEST GENERATIONS; TEST PATTERNS; TRANSITION FAULTS;

DYNAMIC RANDOM ACCESS STORAGE; NETWORKS (CIRCUITS); TIME MEASUREMENT;

TESTING;

EID: 48049086114     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2007.4388063     Document Type: Conference Paper

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